In situ nanometer-resolution strain and orientation mapping for gas-solid reactions via precession-assisted four-dimensional scanning transmission electron microscopy
Yongwen Sun , Ying Han , Dan Zhou , Athanassios S. Galanis , Alejandro Gomez-Perez , Ke Wang , Stavros Nicolopoulos , Hugo Pérez-Garza , Yang Yang
{"title":"In situ nanometer-resolution strain and orientation mapping for gas-solid reactions via precession-assisted four-dimensional scanning transmission electron microscopy","authors":"Yongwen Sun , Ying Han , Dan Zhou , Athanassios S. Galanis , Alejandro Gomez-Perez , Ke Wang , Stavros Nicolopoulos , Hugo Pérez-Garza , Yang Yang","doi":"10.1016/j.nantod.2025.102784","DOIUrl":null,"url":null,"abstract":"<div><div>Chemomechanical interactions in gas or liquid environments are crucial for the functionality and longevity of various materials used in sustainable energy technologies, such as rechargeable batteries, water-splitting catalysts, and next-generation nuclear reactors. A comprehensive understanding of nanoscale strain evolution involved in these processes can advance our knowledge of underlying mechanisms and facilitate material design improvements. However, traditional microscopy workflows face challenges due to trade-offs between field of view (FOV), spatial resolution, temporal resolution, and electron beam damage, particularly in gas or liquid environments. Here, we demonstrate <em>in situ</em> nanometer-resolution strain and orientation mapping in a temperature-controlled gas environment with a large FOV. This is achieved by integrating a microelectromechanical system (MEMS)-based closed-cell TEM holder, precession-assisted four-dimensional scanning transmission electron microscopy (4D-STEM), and a direct electron detector (DED). Using the strain evolution during zirconium initial oxidation as a case study, we first outline critical strategies for focused ion beam (FIB) gas-cell sample preparation and gas-phase TEM workflows to enhance experimental success. We then show that integrating DED with precession electron diffraction (PED) and optimizing gas pressure substantially improve the quantity and quality of the detected Bragg peaks in nano-beam electron diffraction (NBED) patterns, enabling more precise strain and orientation measurements. Furthermore, we introduce a practical protocol to pause the reactions, allowing sufficient time for 4D-STEM data collection while ensuring the temporal resolution needed to resolve material dynamics. Our methodology and workflow provide a robust framework for quantitative analysis of chemomechanical evolutions in materials exposed to gas or liquid environments, paving the way for improved material design in energy-related applications.</div></div>","PeriodicalId":395,"journal":{"name":"Nano Today","volume":"64 ","pages":"Article 102784"},"PeriodicalIF":10.9000,"publicationDate":"2025-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nano Today","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1748013225001562","RegionNum":1,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"CHEMISTRY, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
Chemomechanical interactions in gas or liquid environments are crucial for the functionality and longevity of various materials used in sustainable energy technologies, such as rechargeable batteries, water-splitting catalysts, and next-generation nuclear reactors. A comprehensive understanding of nanoscale strain evolution involved in these processes can advance our knowledge of underlying mechanisms and facilitate material design improvements. However, traditional microscopy workflows face challenges due to trade-offs between field of view (FOV), spatial resolution, temporal resolution, and electron beam damage, particularly in gas or liquid environments. Here, we demonstrate in situ nanometer-resolution strain and orientation mapping in a temperature-controlled gas environment with a large FOV. This is achieved by integrating a microelectromechanical system (MEMS)-based closed-cell TEM holder, precession-assisted four-dimensional scanning transmission electron microscopy (4D-STEM), and a direct electron detector (DED). Using the strain evolution during zirconium initial oxidation as a case study, we first outline critical strategies for focused ion beam (FIB) gas-cell sample preparation and gas-phase TEM workflows to enhance experimental success. We then show that integrating DED with precession electron diffraction (PED) and optimizing gas pressure substantially improve the quantity and quality of the detected Bragg peaks in nano-beam electron diffraction (NBED) patterns, enabling more precise strain and orientation measurements. Furthermore, we introduce a practical protocol to pause the reactions, allowing sufficient time for 4D-STEM data collection while ensuring the temporal resolution needed to resolve material dynamics. Our methodology and workflow provide a robust framework for quantitative analysis of chemomechanical evolutions in materials exposed to gas or liquid environments, paving the way for improved material design in energy-related applications.
期刊介绍:
Nano Today is a journal dedicated to publishing influential and innovative work in the field of nanoscience and technology. It covers a wide range of subject areas including biomaterials, materials chemistry, materials science, chemistry, bioengineering, biochemistry, genetics and molecular biology, engineering, and nanotechnology. The journal considers articles that inform readers about the latest research, breakthroughs, and topical issues in these fields. It provides comprehensive coverage through a mixture of peer-reviewed articles, research news, and information on key developments. Nano Today is abstracted and indexed in Science Citation Index, Ei Compendex, Embase, Scopus, and INSPEC.