{"title":"NXSIM: A normalized XRF standardless iterative simulation method for qualitative and quantitative XRF analysis via MCNP","authors":"K. Yavaş, O. Toker, Ö. Akcali, O. İçelli","doi":"10.1016/j.nimb.2025.165739","DOIUrl":null,"url":null,"abstract":"<div><div>A normalized XRF standardless iterative simulation method (NXSIM) is proposed. Various methods are available to perform quantitative analysis with the XRF method. Many of these methods have laborious and costly processes that require sample preparations, specific reference materials, and repeated measurements. For such reasons, researchers continue to search for methods that provide more accurate and faster results. The main goals of this study are to obtain much faster results with acceptable accuracy by eliminating the need for repeated experimental measurements and reference samples. In this study, XRF spectrometry simulations were carried out with the scattering geometry designed in the MCNP 6.2 code system. The obtained results were used to perform quantitative analysis for experimentally prepared samples. After six samples with different element content and composition were prepared by the press pellet method, XRF spectra were obtained experimentally. Simulations were run with random element weight percentages using the elements in the sample. The elemental compositions of the samples were determined by the iteration method developed from the simulation results and experimental results. According to the results obtained, it has been demonstrated that XRF quantitative analysis can be performed by NXSIM with acceptable precision and accuracy.</div></div>","PeriodicalId":19380,"journal":{"name":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","volume":"565 ","pages":"Article 165739"},"PeriodicalIF":1.4000,"publicationDate":"2025-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0168583X25001296","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0
Abstract
A normalized XRF standardless iterative simulation method (NXSIM) is proposed. Various methods are available to perform quantitative analysis with the XRF method. Many of these methods have laborious and costly processes that require sample preparations, specific reference materials, and repeated measurements. For such reasons, researchers continue to search for methods that provide more accurate and faster results. The main goals of this study are to obtain much faster results with acceptable accuracy by eliminating the need for repeated experimental measurements and reference samples. In this study, XRF spectrometry simulations were carried out with the scattering geometry designed in the MCNP 6.2 code system. The obtained results were used to perform quantitative analysis for experimentally prepared samples. After six samples with different element content and composition were prepared by the press pellet method, XRF spectra were obtained experimentally. Simulations were run with random element weight percentages using the elements in the sample. The elemental compositions of the samples were determined by the iteration method developed from the simulation results and experimental results. According to the results obtained, it has been demonstrated that XRF quantitative analysis can be performed by NXSIM with acceptable precision and accuracy.
期刊介绍:
Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.