High-resolution X-ray scanning with a diffuse Huffman-patterned probe to reduce radiation damage.

IF 2.5 3区 物理与天体物理
Journal of Synchrotron Radiation Pub Date : 2025-05-01 Epub Date: 2025-04-09 DOI:10.1107/S1600577525002127
Alaleh Aminzadeh, Andrew M Kingston, Lindon Roberts, David M Paganin, Timothy C Petersen, Imants D Svalbe
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引用次数: 0

Abstract

Scanning objects with a tightly focused beam (of photons or electrons for example) can provide high-resolution images. However, rapid deposition of energy into a small area can damage tissues in organic samples or may rearrange the chemical structure or physical properties of inorganic materials. Scanning an object with a broad, or diffuse, beam can deliver an equivalent probe energy but spread it over a much wider footprint. However, typically the imaging resolution is proportional to the probe diameter and a diffuse probe sacrifices resolution. Here we propose a method to achieve `high resolution' imaging (in the sense that resolution is smaller than the probe diameter) using a diffuse probe. We achieve this by encoding a pattern onto the probe and employing a decoding step to recover a tight delta-like impulse response. Huffman sequences, by design, have the optimal delta-like autocorrelation for aperiodic (non-cyclic) convolution and are well conditioned. Here we adapt 1D Huffman sequences to design 2D Huffman-like discrete arrays as diffuse imaging probes that have spatially broad, relatively thin, uniform intensity profiles and have excellent aperiodic autocorrelation metrics. Examples of broad shaped diffuse beams were developed for the case of X-ray imaging. A variety of masks were fabricated by the deposition of finely structured layers of tantalum on a silicon oxide wafer. The layers form a pattern of discrete pixels that modify the shape of an incident uniform beam of low-energy X-rays as it passes through the mask. The intensity profiles of the X-ray beams after transmission through these masks were validated, first by acquiring direct-detector X-ray images of the masks, and second by raster scanning a pinhole over each mask pattern, pixel-by-pixel, collecting `bucket' signals as applied in traditional ghost imaging. The masks were then used to raster scan the shaped X-ray beam over several simple binary and `gray' test objects, again producing bucket signals, from which sharp reconstructed object images were obtained by deconvolving their bucket images.

高分辨率x射线扫描与漫射霍夫曼模式探头,以减少辐射损伤。
用紧密聚焦的光束(例如光子或电子)扫描物体可以提供高分辨率的图像。然而,能量快速沉积到一个小区域可能会破坏有机样品中的组织,或者可能会重新排列无机材料的化学结构或物理性质。用宽波束或漫射波束扫描物体可以提供相同的探测能量,但将其传播到更宽的足迹上。然而,通常成像分辨率与探头直径成正比,漫射探头会牺牲分辨率。在这里,我们提出了一种方法来实现“高分辨率”成像(在这个意义上,分辨率小于探头直径)使用漫射探头。我们通过将模式编码到探针上并采用解码步骤来恢复紧密的类delta脉冲响应来实现这一点。通过设计,霍夫曼序列对于非周期(非循环)卷积具有最佳的类delta自相关,并且条件良好。在这里,我们采用一维霍夫曼序列来设计二维类霍夫曼离散阵列作为漫射成像探针,具有空间宽,相对薄,均匀的强度分布,并具有出色的非周期自相关指标。在x射线成像的情况下,开发了宽形漫射光束的例子。通过在氧化硅晶片上沉积结构精细的钽层,制备了多种掩模。这些层形成了一个离散像素的图案,当低能x射线入射均匀光束穿过掩模时,这些像素改变了入射光束的形状。首先,通过获取掩模的直接探测器x射线图像,然后通过光栅扫描每个掩模图案上的针孔,逐像素地收集传统鬼影成像中应用的“桶”信号,验证了x射线光束通过这些掩模后的强度分布。然后使用掩模对几个简单的二进制和“灰色”测试对象上的形状x射线光束进行光栅扫描,再次产生桶信号,从中通过对桶图像进行反卷积获得清晰的重建目标图像。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Synchrotron Radiation
Journal of Synchrotron Radiation INSTRUMENTS & INSTRUMENTATIONOPTICS&-OPTICS
CiteScore
5.60
自引率
12.00%
发文量
289
审稿时长
1 months
期刊介绍: Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehensive coverage of the entire field of synchrotron radiation and free-electron laser research including instrumentation, theory, computing and scientific applications in areas such as biology, nanoscience and materials science. Rapid publication ensures an up-to-date information resource for scientists and engineers in the field.
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