Kerui Wei, Matthew Lindley, Xuzhao Liu, Sarah J Haigh, Ping Xiao, Philip J Withers, Anamul Haq Mir, Graeme Greaves, João P Martins, Junquan Lao, Xiangli Zhong
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引用次数: 0
Abstract
Focused ion beam (FIB) systems have revolutionized sample preparation for transmission electron microscopy (TEM), enabling precise and site-specific material analysis. However, the conventional ion beam-induced deposition (IBID) approach to preparing FIB samples can lead to contamination effects that can compromise the quality of TEM data acquisition. This study introduces an innovative FIB method for connecting TEM lamellae to support grids via redeposition, avoiding the contamination issue. We demonstrate the effectiveness of this technique through observations of a SiC phase within tristructural-isotropic particles during in situ high-temperature and irradiation TEM experiments, establishing an improved process for characterizing material behaviors during exposure to their industrially relevant environmental conditions.
期刊介绍：
Microscopy and Microanalysis publishes original research papers in the fields of microscopy, imaging, and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science. The journal provides significant articles that describe new and existing techniques and instrumentation, as well as the applications of these to the imaging and analysis of microstructure. Microscopy and Microanalysis also includes review articles, letters to the editor, and book reviews.
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