Impact of Spontaneous Orientation Polarization in the Emission Layer on the Charge Accumulation and Exciton−Polaron Quenching Properties of Ir-Complex-based Organic Light-Emitting Diodes

IF 4.3 3区材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC

ACS Applied Electronic Materials Pub Date : 2025-04-28 DOI:10.1021/acsaelm.5c0035510.1021/acsaelm.5c00355

Shotaro Nakano, and , Yutaka Noguchi*,

{"title":"Impact of Spontaneous Orientation Polarization in the Emission Layer on the Charge Accumulation and Exciton−Polaron Quenching Properties of Ir-Complex-based Organic Light-Emitting Diodes","authors":"Shotaro Nakano,  and , Yutaka Noguchi*, ","doi":"10.1021/acsaelm.5c0035510.1021/acsaelm.5c00355","DOIUrl":null,"url":null,"abstract":"<p >Controlling the charge accumulation properties of organic light-emitting diodes (OLEDs) is crucial for optimizing the device performance. In particular, the charge distribution in the vicinity of the emission layer (EML) affects the device efficiency and lifetime, as it determines the emission zone and exciton−polaron quenching (EPQ) characteristics. This study investigates the impact of spontaneous orientation polarization (SOP) in the EML on the charge accumulation and EPQ characteristics of Ir-complex-based OLEDs using displacement current measurements combined with photoluminescence intensity measurements and device simulations. A significant SOP is induced in the EML depending on the SOP-active material content, which modifies the accumulated charge distribution in the EML. Notably, the SOP can suppress the EPQ, particularly when the energy offset at the interface between the hole transport layer and the EML is small. These findings highlight the importance of SOP in optimizing the OLED device performance.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"7 9","pages":"4182–4190 4182–4190"},"PeriodicalIF":4.3000,"publicationDate":"2025-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"88","ListUrlMain":"https://pubs.acs.org/doi/10.1021/acsaelm.5c00355","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}

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Abstract

Controlling the charge accumulation properties of organic light-emitting diodes (OLEDs) is crucial for optimizing the device performance. In particular, the charge distribution in the vicinity of the emission layer (EML) affects the device efficiency and lifetime, as it determines the emission zone and exciton−polaron quenching (EPQ) characteristics. This study investigates the impact of spontaneous orientation polarization (SOP) in the EML on the charge accumulation and EPQ characteristics of Ir-complex-based OLEDs using displacement current measurements combined with photoluminescence intensity measurements and device simulations. A significant SOP is induced in the EML depending on the SOP-active material content, which modifies the accumulated charge distribution in the EML. Notably, the SOP can suppress the EPQ, particularly when the energy offset at the interface between the hole transport layer and the EML is small. These findings highlight the importance of SOP in optimizing the OLED device performance.

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发射层自发取向极化对ir基有机发光二极管电荷积累和激子-极化子猝灭性能的影响

控制有机发光二极管（oled）的电荷积累特性是优化器件性能的关键。发射层（EML）附近的电荷分布决定了发射区和激子-极化子猝灭（EPQ）特性，从而影响器件的效率和寿命。本研究利用位移电流测量、光致发光强度测量和器件模拟研究了EML中自发取向极化（SOP）对ir -配合物oled电荷积累和EPQ特性的影响。根据SOP活性物质的含量，EML中会产生显著的SOP，这会改变EML中累积电荷的分布。值得注意的是，SOP可以抑制EPQ，特别是当空穴传输层和EML界面处的能量偏移很小时。这些发现突出了SOP在优化OLED器件性能中的重要性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

ACS Applied Electronic Materials Multiple-

CiteScore

7.20

自引率

4.30%

发文量

567

期刊介绍： ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/Abstracted： Web of Science SCIE Scopus CAS INSPEC Portico