Effect of substitution and processing on the morphology and dielectric properties of Pr2/3Cu3Ti4O12 (PCTO) ceramic

Bradley Arnold, Ching Hua Su, Fow-Sen Choa, Brian Cullum, Tagide deCarvalho, Narsimha S. Prasad, Lauren N. Gower, Anna C. Darden, Krishna S. Machuga, Narsingh Bahadur Singh
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Abstract

Low-cost, large dielectric constant, and resistivity materials have wide range of applications for radio frequency systems, flash memory devices to ferroelectric switches, and energy storage applications. The paper reports on the development and characterization of high-resistivity Pr2/3Cu3Ti4O12 (PCTO) ceramics developed by doping with Ca2+ and Sr2+ ions under various processing conditions. In particular, synthesis and growth were performed at 1173 and 1273 K resulting in significant difference in both electrical and morphological properties. To alter the distortion and polarity of ceramics, low concentration (0.15 mole fraction) of Ca2+ and Sr2+ hetero-valent ions with different size were substituted for Pr3+. The evolution and sizes of non-spherical, non-faceted grains altered to facet shapes due to changes in the anisotropy developed with increased copper concentration in the grains. The morphology analysis at these low processing temperatures revealed that grain growth occurs by engulfment of smaller grains by larger grains, necking process, and channel formation, with particles growing in nanometer size to greater than 10 µm and forming new layers on top of grains. The migration of copper-rich phases above 1173 K from boundaries to grains causes faceted morphology in both pure and substituted PCTO. Finally, by substituting Ca2+ and Sr2+ into the ceramics, altering the processing temperature, resistivity, and dielectric constant significantly increased. The substituted ceramics showed a higher dielectric constant at applied frequencies of 100‒100 000 Hz and did not vary at bias voltages of 50‒1000 mV, indicating no breakdown of the ceramics.

Abstract Image

取代和加工对Pr2/3Cu3Ti4O12 (PCTO)陶瓷形貌和介电性能的影响
低成本、大介电常数和电阻率材料在射频系统、闪存器件、铁电开关和能量存储应用中有着广泛的应用。本文报道了在不同的工艺条件下,通过掺杂Ca2+和Sr2+离子制备高电阻率Pr2/3Cu3Ti4O12 (PCTO)陶瓷的研制和表征。特别是,在1173和1273 K下进行合成和生长,导致电学和形态学性质的显著差异。为了改变陶瓷的畸变和极性,用低浓度(0.15摩尔分数)不同大小的Ca2+和Sr2+异价离子取代Pr3+。随着铜浓度的增加,非球形、非面形晶粒的演化和尺寸由各向异性的变化转变为面形晶粒。在低温下的形貌分析表明,晶粒的生长主要通过大晶粒对小晶粒的吞没、颈缩过程和沟道形成等方式进行,晶粒的纳米级尺寸生长到大于10µm,并在晶粒表面形成新的层。在1173 K以上,富铜相从晶界向晶粒的迁移导致了纯PCTO和取代PCTO的多面形貌。最后,通过在陶瓷中加入Ca2+和Sr2+,改变加工温度,电阻率和介电常数显著增加。所取代的陶瓷在100-100 000 Hz的施加频率下具有较高的介电常数,在50-1000 mV的偏置电压下没有变化,表明陶瓷没有击穿。
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