Modeling and simulation of transient dose rate effect on power distribution networks of system-in-package

IF 2.6 3区工程技术 Q1 NUCLEAR SCIENCE & TECHNOLOGY

Nuclear Engineering and Technology Pub Date : 2025-04-15 DOI:10.1016/j.net.2025.103652

Yang Li , Rong Lu , Wenjun Li , Dongwei Chen , Ning Li , Chaohui He , Junlin Li , Jinlei Wang , Fangpei Li , Guohe Zhang

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引用次数: 0

Abstract

This paper investigates the transient dose rate effect (TDRE) on the power distribution networks (PDNs) of the SZ0501 system-in-package (SiP). Previous experimental results have revealed significant differences in failure thresholds between the SZ0501 SiP and its prototype printed circuit board (PCB).

To interpret these experimental findings, this study focuses on the PDNs of the SZ0501 SiP and develops optimized transient simulation models. Building on traditional Power Integrity (PI) and Signal Integrity (SI) co-simulation models, transient simulation models are developed by incorporating photocurrents into the PDNs. Transient simulations are conducted for both SiP and its prototype PCB under three conditions, including non-radiation, short- or long-pulse photocurrent injections, single- or multi-pulse photocurrent injections, especially considering the coupling effect in the multiple injection case. Simulation results indicate the power supply noise induced by transient photocurrents is obvious and considerably impacts the power supply stability. A comparison with the previous experimental data reveals that the prototype PCB possessing independent PDNs demonstrates greater stability under transient γ irradiation than the SiP with shared PDNs. This study underscores the importance of considering PDNs in the design of miniaturized systems to enhance the system reliability in transient radiation environments.

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系统级配网暂态剂量率效应的建模与仿真

本文研究了SZ0501系统级封装（SiP）配电网的瞬态剂量率效应（TDRE）。先前的实验结果显示，SZ0501 SiP及其原型印刷电路板（PCB）之间的故障阈值存在显着差异。为了解释这些实验结果，本研究重点研究了SZ0501 SiP的pdn，并开发了优化的瞬态仿真模型。在传统的功率完整性（PI）和信号完整性（SI）联合仿真模型的基础上，通过将光电流纳入pdn，建立了瞬态仿真模型。对SiP及其原型PCB进行了非辐射、短脉冲或长脉冲光电流注入、单脉冲或多脉冲光电流注入三种情况下的瞬态仿真，特别考虑了多脉冲光电流注入情况下的耦合效应。仿真结果表明，瞬态光电流引起的电源噪声非常明显，对电源的稳定性有很大影响。通过与已有实验数据的比较，发现具有独立pdn的原型PCB在瞬态γ辐照下的稳定性优于具有共享pdn的原型PCB。该研究强调了在小型化系统设计中考虑pdn对于提高系统在瞬态辐射环境中的可靠性的重要性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Nuclear Engineering and Technology 工程技术-核科学技术

CiteScore

4.80

自引率

7.40%

发文量

431

审稿时长

3.5 months

期刊介绍： Nuclear Engineering and Technology (NET), an international journal of the Korean Nuclear Society (KNS), publishes peer-reviewed papers on original research, ideas and developments in all areas of the field of nuclear science and technology. NET bimonthly publishes original articles, reviews, and technical notes. The journal is listed in the Science Citation Index Expanded (SCIE) of Thomson Reuters. NET covers all fields for peaceful utilization of nuclear energy and radiation as follows: 1) Reactor Physics 2) Thermal Hydraulics 3) Nuclear Safety 4) Nuclear I&C 5) Nuclear Physics, Fusion, and Laser Technology 6) Nuclear Fuel Cycle and Radioactive Waste Management 7) Nuclear Fuel and Reactor Materials 8) Radiation Application 9) Radiation Protection 10) Nuclear Structural Analysis and Plant Management & Maintenance 11) Nuclear Policy, Economics, and Human Resource Development