Corrections to “Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications”

IF 5.6 2区工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Instrumentation and Measurement Pub Date : 2025-04-30 DOI:10.1109/TIM.2025.3561610

Junho Kang;Woosol Han;Suhwan Kim;Jaehoon Jun

引用次数: 0

Abstract

Presents corrections to the paper, (Corrections to “Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications”).

查看原文本刊更多论文

对“用于直流测量应用的具有超低1/ f角的高分辨率读出IC的设计和性能评估方法的综合分析”的修正

提出了对论文的更正，（更正“用于直流测量应用的具有超低1/ f角的高分辨率读出IC的设计和性能评估方法的综合分析”）。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Transactions on Instrumentation and Measurement 工程技术-工程：电子与电气

CiteScore

9.00

自引率

23.20%

发文量

1294

审稿时长

3.9 months

期刊介绍： Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.