Acid-modified Cu–Ce/HZSM-5 adsorbent removes trace phosphorus impurities from recycled hydrogen during polysilicon production†

IF 3.9 3区 化学 Q2 CHEMISTRY, MULTIDISCIPLINARY
RSC Advances Pub Date : 2025-04-29 DOI:10.1039/D5RA01322D
Zhiyuan Liu and Guoqiang Huang
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Abstract

In this study, an acid-modified Cu–Ce/HZSM-5 bimetallic adsorbent was developed for the removal of trace PH3 impurities from simulated recycled hydrogen in a chemical vapor deposition furnace for polysilicon production. A systematic examination was subsequently conducted to examine the effects of acidic substance type and concentration, and the addition of Ce on the adsorbent's ability to remove PH3. The results showed that the adsorbent, when treated with 13% HNO3 and an appropriate level of Ce (nCe : nCu = 1 : 40), exhibited superior adsorption performance, achieving a PH3 breakthrough adsorption capacity of 135.2 mg g−1. After three regeneration cycles, the sorbent achieved optimal performance. Further investigation indicated that the improved efficiency of this sorbent in removing PH3 was primarily due to the formation of Cu2(OH)3NO3, an increase in microporous volume, the enhanced distribution of metallic oxides, a higher quantity of reactive oxygen species on the surface, an increased concentration of acidic sites, and the exposure of additional reactive species (Cu2(OH)3NO3, CuO). Moreover, X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) characterization indicated that the deactivation of the adsorbent was mainly caused by the continuous consumption of Cu2(OH)3NO3 and CuO, along with the accumulation of reaction products (P2O5, Cu3P, Cu (PO3)2, and Cu2P2O7) on the adsorbent surface.

酸改性Cu-Ce /HZSM-5吸附剂去除多晶硅生产过程中回收氢气中的微量磷杂质
在本研究中,开发了一种酸改性Cu-Ce /HZSM-5双金属吸附剂,用于去除用于多晶硅生产的化学气相沉积炉中模拟循环氢气中的痕量PH3杂质。随后进行了系统的检查,以检查酸性物质类型和浓度以及添加Ce对吸附剂去除PH3能力的影响。结果表明,该吸附剂在HNO3浓度为13%和Ce (nCe: nCu = 1:40)的条件下,具有优异的吸附性能,突破PH3吸附量为135.2 mg g−1。经过三次再生循环,吸附剂达到了最佳性能。进一步的研究表明,该吸附剂去除PH3的效率的提高主要是由于Cu2(OH)3NO3的形成、微孔体积的增加、金属氧化物的分布增强、表面活性氧的数量增加、酸性位点的浓度增加以及额外的活性物质(Cu2(OH)3NO3、CuO)的暴露。x射线衍射(XRD)和x射线光电子能谱(XPS)表征表明,吸附剂失活的主要原因是Cu2(OH)3NO3和CuO的持续消耗,以及反应产物(P2O5、Cu3P、Cu (PO3)2和Cu2P2O7)在吸附剂表面的积累。
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来源期刊
RSC Advances
RSC Advances chemical sciences-
CiteScore
7.50
自引率
2.60%
发文量
3116
审稿时长
1.6 months
期刊介绍: An international, peer-reviewed journal covering all of the chemical sciences, including multidisciplinary and emerging areas. RSC Advances is a gold open access journal allowing researchers free access to research articles, and offering an affordable open access publishing option for authors around the world.
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