{"title":"Microlens Array-Based Beam Profile and Wavefront Sensor With Physical Constraint Learning","authors":"Feng-Chun Hsu;Chun-Yu Lin;Chia-Yuan Chang;Shean-Jen Chen","doi":"10.1109/JPHOT.2025.3561931","DOIUrl":null,"url":null,"abstract":"The beam profile and wavefront characteristics of laser beams are essential for numerous laser applications, including micromachining and microfabrication. However, conventional wavefront sensors, such as the Shack-Hartmann wavefront sensor (SHWS), are limited by reduced accuracy in detecting local distortions and sensitivity to non-uniform beam profiles. Additionally, beam profile information is crucial for such applications. This paper introduces a new methodology that utilizes an SHWS-like structure to overcome these limitations. By employing a physical constraint learning approach, the proposed method simultaneously provides highly accurate wavefront and beam profile data. We first develop a pretrained network using microlens array (MLA) simulation datasets. To implement a practical MLA-based measurement system, this pretrained network is further fine-tuned with datasets modulated by a spatial light modulator in the system setup. Experimental results demonstrate that the proposed network can reconstruct both beam profiles and wavefronts in real-time. Compared to traditional SHWS reconstruction techniques, our approach enhances computation speed by over 100 times, while also providing beam intensity profile information and increasing wavefront sensing accuracy by approximately fivefold.","PeriodicalId":13204,"journal":{"name":"IEEE Photonics Journal","volume":"17 3","pages":"1-6"},"PeriodicalIF":2.1000,"publicationDate":"2025-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10967538","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Photonics Journal","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10967538/","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The beam profile and wavefront characteristics of laser beams are essential for numerous laser applications, including micromachining and microfabrication. However, conventional wavefront sensors, such as the Shack-Hartmann wavefront sensor (SHWS), are limited by reduced accuracy in detecting local distortions and sensitivity to non-uniform beam profiles. Additionally, beam profile information is crucial for such applications. This paper introduces a new methodology that utilizes an SHWS-like structure to overcome these limitations. By employing a physical constraint learning approach, the proposed method simultaneously provides highly accurate wavefront and beam profile data. We first develop a pretrained network using microlens array (MLA) simulation datasets. To implement a practical MLA-based measurement system, this pretrained network is further fine-tuned with datasets modulated by a spatial light modulator in the system setup. Experimental results demonstrate that the proposed network can reconstruct both beam profiles and wavefronts in real-time. Compared to traditional SHWS reconstruction techniques, our approach enhances computation speed by over 100 times, while also providing beam intensity profile information and increasing wavefront sensing accuracy by approximately fivefold.
期刊介绍:
Breakthroughs in the generation of light and in its control and utilization have given rise to the field of Photonics, a rapidly expanding area of science and technology with major technological and economic impact. Photonics integrates quantum electronics and optics to accelerate progress in the generation of novel photon sources and in their utilization in emerging applications at the micro and nano scales spanning from the far-infrared/THz to the x-ray region of the electromagnetic spectrum. IEEE Photonics Journal is an online-only journal dedicated to the rapid disclosure of top-quality peer-reviewed research at the forefront of all areas of photonics. Contributions addressing issues ranging from fundamental understanding to emerging technologies and applications are within the scope of the Journal. The Journal includes topics in: Photon sources from far infrared to X-rays, Photonics materials and engineered photonic structures, Integrated optics and optoelectronic, Ultrafast, attosecond, high field and short wavelength photonics, Biophotonics, including DNA photonics, Nanophotonics, Magnetophotonics, Fundamentals of light propagation and interaction; nonlinear effects, Optical data storage, Fiber optics and optical communications devices, systems, and technologies, Micro Opto Electro Mechanical Systems (MOEMS), Microwave photonics, Optical Sensors.