K. Niskanen;A. Javanainen;C. Martinella;W. Hajdas;U. Grossner;H. Kettunen
{"title":"Proton Energy Dependence of SiC Power MOSFET Single-Event Burnout Sensitivity","authors":"K. Niskanen;A. Javanainen;C. Martinella;W. Hajdas;U. Grossner;H. Kettunen","doi":"10.1109/TNS.2025.3550609","DOIUrl":null,"url":null,"abstract":"The proton energy dependence of single-event burnout (SEB) sensitivity of silicon carbide (SiC) power MOSFETs is studied. The experimental results show that SEB is dependent on the primary proton energy and the drain bias voltage applied during irradiation. The secondary particles, produced by the nuclear reactions between primary particles and device materials, are studied using Geant4 simulations. A method for finding the criteria for the failure based on experimental radiation data and Geant4 simulation data is presented.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 4","pages":"1412-1417"},"PeriodicalIF":1.9000,"publicationDate":"2025-03-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10924304","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Nuclear Science","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10924304/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The proton energy dependence of single-event burnout (SEB) sensitivity of silicon carbide (SiC) power MOSFETs is studied. The experimental results show that SEB is dependent on the primary proton energy and the drain bias voltage applied during irradiation. The secondary particles, produced by the nuclear reactions between primary particles and device materials, are studied using Geant4 simulations. A method for finding the criteria for the failure based on experimental radiation data and Geant4 simulation data is presented.
期刊介绍:
The IEEE Transactions on Nuclear Science is a publication of the IEEE Nuclear and Plasma Sciences Society. It is viewed as the primary source of technical information in many of the areas it covers. As judged by JCR impact factor, TNS consistently ranks in the top five journals in the category of Nuclear Science & Technology. It has one of the higher immediacy indices, indicating that the information it publishes is viewed as timely, and has a relatively long citation half-life, indicating that the published information also is viewed as valuable for a number of years.
The IEEE Transactions on Nuclear Science is published bimonthly. Its scope includes all aspects of the theory and application of nuclear science and engineering. It focuses on instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.