Investigation on degradation behavior in citric acid solution for MO-Al2O3-SiO2-B2O3 (M = Ba, Sr) glass and its doped BaTiO3 ceramics

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Wanlun Ren, Chun Lu, Lang Li, Yile Zhong, Baoxing Liu, Song Chen
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引用次数: 0

Abstract

This study proposes an innovative strategy for developing a type of BaTiO3 ceramic, which can degrade in citric acid solution, offering the potential for harmless degradation and recycling of BaTiO3 ceramics widely used in the electronics field. The degradable BaTiO3 ceramic has been designed and prepared using chemically active MO-Al2O3-SiO2-B2O3 (M = Ba, Sr) (MASB) glass. By adjusting the glass content, the dielectric constant of the material increases from 725 to 1480. By investigating the physical and chemical interactions between MASB glass phases and BaTiO3 ceramics, we systematically evaluated the degradation behavior in citric acid solution and the dielectric properties of the BaTiO3 ceramics. The results show that the ratio of [TiO6] units to [TiO4] units in glass phases is a crucial factor in determining the chemical stability of BaTiO3-doped MASB glass in citric acid solution. As the ratio of [TiO6] units to [TiO4] units increases from 0.347 to 0.464, the mass loss rate of the BaTiO3-doped BASB glasses in citric acid decreases from 70% to 36.1%. Through SEM–EDS analysis of the BaTiO3 ceramics, it was found that the degradation of MASB glass phase between the BaTiO3 grains in citric acid solution triggers the structural disintegration of the BaTiO3 ceramics.

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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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