Goran R. Štrbac, Ondrej Bošák, Dragana D. Štrbac, Marian Kubliha, Martin Sahul
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引用次数: 0
Abstract
This study presents the results of electrical conductivity measurements for glasses from the SbxAs37-xS48I15 system, conducted in both DC and AC regimes. Measurements were carried out on both amorphous and annealed samples, with crystallization of SbSI and Sb2S3 structural units induced in the latter. The findings reveal that the conductivity of the annealed samples is several times higher than that of the amorphous samples, which could be crucial information for applications in electronics, such as memory devices. The temperature dependence of conductivity follows Arrhenius behavior, with the activation energy EDC determined by fitting the DC conductivity data to the temperature variation. This activation energy decreases as the proportion of antimony increases. Frequency-dependent conductivity tests revealed that conductivity rises with higher temperature, increased antimony content, and frequency. Measurements were taken across a frequency range of 0 to 105 Hz and a temperature range from room temperature to 398 K. The EAC values at 100 Hz and 1000 Hz were also obtained, indicating complex relaxation mechanisms in this regime. Impedance spectra were analyzed using an equivalent circuit model, allowing the determination of relaxation time values and the activation energies associated with the relaxation process. The presence of a temperature-dependent electrical relaxation phenomenon of the non-Debye type was confirmed. Additionally, the effects of frequency and temperature on the loss factor (ε′′) were analyzed within the measured frequency range.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.