Hidayath Mirza, Abdoh Jabbari, Muhammad Shahid Rashid, Ali Asghar, Shahzad Ahmed, Haneef Khan, Nishat Sultana, Syed Kashif Ali, Mohd Imran
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引用次数: 0
Abstract
Hydrogen peroxide (H2O2) detection is crucial in biological, environmental, and industrial contexts, serving as a biomarker for oxidative stress, an enzymatic reaction product, and a common oxidizing agent. Metal–organic frameworks (MOFs) have emerged as promising candidates for electrochemical sensors due to their unique structural properties and tunable characteristics. This study reports the synthesis and characterization of a cobalt metal–organic framework (Co-MOF) as an electrochemical platform for H2O2 detection. The Co-MOF was synthesized via a two-step procedure: formation of the organic ligand (H2L) followed by coordination with cobalt centers. Electrochemical characterization revealed excellent electron transfer properties with a surface-controlled process (b = 0.992) and diffusion-controlled kinetics. The sensor exhibited a high sensitivity of 91.75 μA/μM/cm2 towards H2O2, with a linear response range of 2–1000 μM and a detection limit of 0.25 μM (S/N = 3). The enhanced sensing performance can be attributed to synergistic mechanisms: rapid electron transfer via Co centers, facilitated mass transport through the porous structure, and efficient catalytic decomposition of H2O2. Electrochemical impedance spectroscopy indicated a low charge transfer resistance (~ 200 Ω), suggesting favorable interfacial properties. This study establishes a foundation for developing high-performance MOF-based electrochemical sensors for H2O2 detection in biological and environmental applications, with potential utility in clinical diagnostics, environmental monitoring, and industrial process control.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.