Wei Liu , Xueping Xu , Zhenkai Zhao , Weiwei Wu , Lei Wang
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引用次数: 0
Abstract
Magnetic shielding devices (MSDs) provide a near-zero magnetic environment crucial for magnetoencephalography (MEG) measurements. Accurate calculation and suppression of magnetic noise are essential for achieving high-sensitivity. Yet, existing magnetic noise calculation methods often overlook the anisotropy and uneven distribution of magnetic flux density in laminated nanocrystalline materials. This paper introduces a novel magnetic noise calculation model that accounts for anisotropy. Furthermore, a magnetic circuit network model is developed, yielding analytical expressions for magnetic flux density across various hierarchical levels. Building on this framework, the magnetic noise calculation model is refined with the incorporation of correction coefficients. The implementation of transverse magnetic annealing effectively reduces material losses, coercivity, and residual magnetization, while significantly enhancing permeability. Finally, the accuracy of the magnetic noise calculation method was experimentally validated, demonstrating a minimal error of just 2.39 % between the experimental and calculated values of magnetic noise. This advancement is crucial for enhancing the sensitivity of MEG measurements by effectively reducing magnetic noise in high-performance MSDs.
期刊介绍:
Sensors and Actuators A: Physical brings together multidisciplinary interests in one journal entirely devoted to disseminating information on all aspects of research and development of solid-state devices for transducing physical signals. Sensors and Actuators A: Physical regularly publishes original papers, letters to the Editors and from time to time invited review articles within the following device areas:
• Fundamentals and Physics, such as: classification of effects, physical effects, measurement theory, modelling of sensors, measurement standards, measurement errors, units and constants, time and frequency measurement. Modeling papers should bring new modeling techniques to the field and be supported by experimental results.
• Materials and their Processing, such as: piezoelectric materials, polymers, metal oxides, III-V and II-VI semiconductors, thick and thin films, optical glass fibres, amorphous, polycrystalline and monocrystalline silicon.
• Optoelectronic sensors, such as: photovoltaic diodes, photoconductors, photodiodes, phototransistors, positron-sensitive photodetectors, optoisolators, photodiode arrays, charge-coupled devices, light-emitting diodes, injection lasers and liquid-crystal displays.
• Mechanical sensors, such as: metallic, thin-film and semiconductor strain gauges, diffused silicon pressure sensors, silicon accelerometers, solid-state displacement transducers, piezo junction devices, piezoelectric field-effect transducers (PiFETs), tunnel-diode strain sensors, surface acoustic wave devices, silicon micromechanical switches, solid-state flow meters and electronic flow controllers.
Etc...