Grzegorz Cios, Aimo Winkelmann, Tomasz Tokarski, Piotr Bala
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引用次数: 0
Abstract
Pattern matching approaches to electron backscatter diffraction (EBSD) in the scanning elec-tron microscope (SEM) provide qualitatively new possibilities for the microstructural analysis of chiral non-centrosymmetric phases due to the influence of dynamical electron diffraction effects on the formation of EBSD Kikuchi patterns. In the present study, we analyze the mi-crostructure of polycrystalline α-quartz in an agate mineral sample. We identify characteristic intra-grain inversion domains of different handedness which are well-known from classical po-larized light microscopy. As a result, the handedness-resolved microstructure of quartz can be imaged with the spatial and orientation resolution provided by EBSD in the SEM.
期刊介绍:
Materials Characterization features original articles and state-of-the-art reviews on theoretical and practical aspects of the structure and behaviour of materials.
The Journal focuses on all characterization techniques, including all forms of microscopy (light, electron, acoustic, etc.,) and analysis (especially microanalysis and surface analytical techniques). Developments in both this wide range of techniques and their application to the quantification of the microstructure of materials are essential facets of the Journal.
The Journal provides the Materials Scientist/Engineer with up-to-date information on many types of materials with an underlying theme of explaining the behavior of materials using novel approaches. Materials covered by the journal include:
Metals & Alloys
Ceramics
Nanomaterials
Biomedical materials
Optical materials
Composites
Natural Materials.