Kurapati Kalyan, Sailakshmi Janga, Shaik M. Abzal, Paramita Maiti, Deepak Kumar Gupta, T. R. Ravindran, Rajkumar Patel, Jatis Kumar Dash
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引用次数: 0
Abstract
In this study, we successfully synthesized α-MoO3 nanolayers using a proximity evaporation technique, positioning the Mo film approximately 1 mm from the target substrate at atmospheric conditions. This novel method bypasses the need for supplemental oxygen sources by utilizing ambient oxygen, resulting in cost-effective and scalable production of MoO3. The α-MoO3 films synthesized at an optimal growth temperature of 550 °C demonstrate well-controlled layer thickness, high crystallinity, and uniform stoichiometry. Detailed characterizations were performed, including XRD for crystallographic confirmation, SEM–EDS for morphology and stoichiometry, Raman spectroscopy for vibrational modes, and UV–Vis for optical properties, revealing a tunable bandgap of approximately 3.7 eV. I-V measurements indicated a high resistance of 8.7 × 106 Ω, confirming the material’s insulating nature, and an optimum dielectric constant of 1253. Photo-response measurements demonstrated a significant photocurrent increase under illumination, with responsivity 8.8 A.W−1, detectivity1.2 × 1013 J, and quantum efficiency of 18.5%, respectively. The proposed proximity evaporation technique demonstrates potential as a scalable approach for synthesizing high-quality two-dimensional (2D) transition metal oxides like MoO3, with implications for applications in optoelectronics and sensing.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.