Keyue Liang, Xintong Yuan, Xin Chen, Bo Liu, Jung Tae Kim, Jiayi Yu, Dingyi Zhao, Yuzhang Li
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引用次数: 0
Abstract
Cryogenic electron microscopy (cryo-EM) has shown great promise in preserving and characterizing beam-sensitive battery materials and interfaces at atomic resolution. With the growing interest in adopting cryo-EM for battery research, this review provides detailed and practical guidance for researchers on cryo-EM workflows including sample preparation and transfer, imaging, data acquisition, and analysis. Strategies for minimizing artifacts during sample preparation and imaging processes are discussed along with approaches to address potential pitfalls in data analysis to ensure accurate interpretation. Finally, this review explores the challenges and opportunities for advancing the cryo-EM technique to further enhance its impact on future developments in battery research.
期刊介绍:
Nano Letters serves as a dynamic platform for promptly disseminating original results in fundamental, applied, and emerging research across all facets of nanoscience and nanotechnology. A pivotal criterion for inclusion within Nano Letters is the convergence of at least two different areas or disciplines, ensuring a rich interdisciplinary scope. The journal is dedicated to fostering exploration in diverse areas, including:
- Experimental and theoretical findings on physical, chemical, and biological phenomena at the nanoscale
- Synthesis, characterization, and processing of organic, inorganic, polymer, and hybrid nanomaterials through physical, chemical, and biological methodologies
- Modeling and simulation of synthetic, assembly, and interaction processes
- Realization of integrated nanostructures and nano-engineered devices exhibiting advanced performance
- Applications of nanoscale materials in living and environmental systems
Nano Letters is committed to advancing and showcasing groundbreaking research that intersects various domains, fostering innovation and collaboration in the ever-evolving field of nanoscience and nanotechnology.