{"title":"Image Forgery Localization With State Space Models","authors":"Zijie Lou;Gang Cao;Kun Guo;Shaowei Weng;Lifang Yu","doi":"10.1109/LSP.2025.3559429","DOIUrl":null,"url":null,"abstract":"Pixel dependency modeling from tampered images is pivotal for image forgery localization. Current approaches predominantly rely on Convolutional Neural Networks (CNNs) or Transformer-based models, which often either lack sufficient receptive fields or entail significant computational overheads. Recently, State Space Models (SSMs), exemplified by Mamba, have emerged as a promising approach. They not only excel in modeling long-range interactions but also maintain a linear computational complexity. In this paper, we propose LoMa, a novel image forgery localization method that leverages the selective SSMs. Specifically, LoMa initially employs atrous selective scan to traverse the spatial domain and convert the tampered image into ordered patch sequences, and subsequently applies multi-directional state space modeling. In addition, an auxiliary convolutional branch is introduced to enhance local feature extraction. Extensive experimental results validate the superiority of LoMa over CNN-based and Transformer-based state-of-the-arts. To our best knowledge, this is the first image forgery localization model constructed based on the SSM-based model. We aim to establish a baseline and provide valuable insights for the future development of more efficient and effective SSM-based forgery localization models.","PeriodicalId":13154,"journal":{"name":"IEEE Signal Processing Letters","volume":"32 ","pages":"1590-1594"},"PeriodicalIF":3.2000,"publicationDate":"2025-04-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Signal Processing Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10959075/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Pixel dependency modeling from tampered images is pivotal for image forgery localization. Current approaches predominantly rely on Convolutional Neural Networks (CNNs) or Transformer-based models, which often either lack sufficient receptive fields or entail significant computational overheads. Recently, State Space Models (SSMs), exemplified by Mamba, have emerged as a promising approach. They not only excel in modeling long-range interactions but also maintain a linear computational complexity. In this paper, we propose LoMa, a novel image forgery localization method that leverages the selective SSMs. Specifically, LoMa initially employs atrous selective scan to traverse the spatial domain and convert the tampered image into ordered patch sequences, and subsequently applies multi-directional state space modeling. In addition, an auxiliary convolutional branch is introduced to enhance local feature extraction. Extensive experimental results validate the superiority of LoMa over CNN-based and Transformer-based state-of-the-arts. To our best knowledge, this is the first image forgery localization model constructed based on the SSM-based model. We aim to establish a baseline and provide valuable insights for the future development of more efficient and effective SSM-based forgery localization models.
期刊介绍:
The IEEE Signal Processing Letters is a monthly, archival publication designed to provide rapid dissemination of original, cutting-edge ideas and timely, significant contributions in signal, image, speech, language and audio processing. Papers published in the Letters can be presented within one year of their appearance in signal processing conferences such as ICASSP, GlobalSIP and ICIP, and also in several workshop organized by the Signal Processing Society.