Palma Sara Letizia;Gabriella Crotti;Giovanni D’Avanzo;Antonio Delle Femine;Claudio Iodice;Mario Luiso;Domenico Giordano
{"title":"A Low-Cost Approach to Generate MV Distorted Voltage for VT Characterization up to 150 kHz","authors":"Palma Sara Letizia;Gabriella Crotti;Giovanni D’Avanzo;Antonio Delle Femine;Claudio Iodice;Mario Luiso;Domenico Giordano","doi":"10.1109/TIM.2025.3557104","DOIUrl":null,"url":null,"abstract":"The increase in disturbances at frequencies higher than 10 kHz in medium voltage (MV) grids has led to new metrological challenges related to the accurate characterization of instrument transformers (ITs), which serve as the primary element in the measurement chain for the monitoring of these disturbances. In this context, this article presents a simple architecture of a generation system for the characterization of MV voltage transformers (VTs) up to 150 kHz under realistic power system waveforms. It is able to generate a MV tone at power frequency and superimposed disturbances having reduced amplitude and higher frequency. Unlike other approaches recently discussed in scientific literature that need two separate voltage sources, the main advantage of the proposed solution is the use of a single source, by suitably compensating its systematic errors through a simple compensation method. As first application, the experimental tests related to the characterization of two commercial VTs (LPVT), an inductive VT and a low power VT, are discussed.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"74 ","pages":"1-9"},"PeriodicalIF":5.6000,"publicationDate":"2025-04-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10947584","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10947584/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The increase in disturbances at frequencies higher than 10 kHz in medium voltage (MV) grids has led to new metrological challenges related to the accurate characterization of instrument transformers (ITs), which serve as the primary element in the measurement chain for the monitoring of these disturbances. In this context, this article presents a simple architecture of a generation system for the characterization of MV voltage transformers (VTs) up to 150 kHz under realistic power system waveforms. It is able to generate a MV tone at power frequency and superimposed disturbances having reduced amplitude and higher frequency. Unlike other approaches recently discussed in scientific literature that need two separate voltage sources, the main advantage of the proposed solution is the use of a single source, by suitably compensating its systematic errors through a simple compensation method. As first application, the experimental tests related to the characterization of two commercial VTs (LPVT), an inductive VT and a low power VT, are discussed.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.