Momin S.M. Abutawahina , A.M. Alghareeb Abbas , N.A. Hamzah , S.S. Ng , H.J. Quah , Naser M. Ahmed , M. Shaveisi
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引用次数: 0
Abstract
This study presents a comprehensive experimental and simulation analysis of bulk c-plane gallium nitride (GaN)-based metal–semiconductor-metal (MSM) ultraviolet (UV) photodetectors (PDs). The PDs were fabricated using a straightforward approach, with silver paste serving as the electrode material. The fabricated devices demonstrated excellent performance, achieving high responsivity (12.8 A/W), sensitivity (1864 %), photo-to-dark current gain (19.64), detectivity (1.11 × 1011 J), low noise equivalent power (1.64 × 10-12 W/cm2Hz½), and fast response times (rise time: 0.1 s, decay time: 0.125 s) under 6 V bias at 365 nm illumination. To further understand the underlying physical mechanisms, a Silvaco TCAD ATLAS simulator was employed, revealing a trend consistent between the simulation results and experimental data. This agreement underscores the reliability and effectiveness of the fabricated GaN-based MSM UV PDs, highlighting their potential for high-performance UV detection applications.
期刊介绍:
The journal provides an international medium for the publication of theoretical and experimental studies and reviews related to the electronic, electrochemical, ionic, magnetic, optical, and biosensing properties of solid state materials in bulk, thin film and particulate forms. Papers dealing with synthesis, processing, characterization, structure, physical properties and computational aspects of nano-crystalline, crystalline, amorphous and glassy forms of ceramics, semiconductors, layered insertion compounds, low-dimensional compounds and systems, fast-ion conductors, polymers and dielectrics are viewed as suitable for publication. Articles focused on nano-structured aspects of these advanced solid-state materials will also be considered suitable.