Hongyi Yang , Ziyi Lai , Wenzhen Wang , Huanzhen Qi , Shaohan Wang , Junfeng Chen , Juan Qin , Hui Zhang , Zebo Fang , Haitao Xu , Run Xu , Yan Zhu
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引用次数: 0
Abstract
Cesium iodide crystals with large sizes are highly desirable for X-ray and γ-ray detection applications. In this study, we have designed a simple and convenient continuous-mass transport process (CMTP) method to obtain large-size, high-quality pure CsI and Tl doped CsI crystals for the first time. This method allows for a continuous replenishment of the raw materials required for crystal growth in the growth container through a solute diff usion process, facilitating the stable growth of large single crystals (up to a size of 23.5 × 21 × 8 mm3). Furthermore, by adjusting the temperature difference between the growth and supplement containers, it is feasible to control the crystal growth rate. Compared with the inverse temperature crystallization (ITC) method, Tl doped CsI crystals grown by the CMTP method exhibit better crystallization quality, with both smaller values and narrower fluctuations for full width at half maximum (FWHM) in the X-ray rocking curve, and achieve comparable energy resolution (6.20 %–6.73 %), decay time (649–657 ns), afterglow level (0.1 % @ 68–98 ms), and higher light yield (78,000–83,000 photons/MeV). Our work provides a promising strategy for the preparation of larger-sized Tl doped CsI single crystals via the CMTP method.
期刊介绍:
Optical Materials has an open access mirror journal Optical Materials: X, sharing the same aims and scope, editorial team, submission system and rigorous peer review.
The purpose of Optical Materials is to provide a means of communication and technology transfer between researchers who are interested in materials for potential device applications. The journal publishes original papers and review articles on the design, synthesis, characterisation and applications of optical materials.
OPTICAL MATERIALS focuses on:
• Optical Properties of Material Systems;
• The Materials Aspects of Optical Phenomena;
• The Materials Aspects of Devices and Applications.
Authors can submit separate research elements describing their data to Data in Brief and methods to Methods X.