Zhangqing He , Junming Zhang , Xinrui Zhu , Siyu Luo , Zhengya Zhang , Zhou Huang
{"title":"A cross-matrix arbiter PUF with high reliability and ML-resistance for IoT device security","authors":"Zhangqing He , Junming Zhang , Xinrui Zhu , Siyu Luo , Zhengya Zhang , Zhou Huang","doi":"10.1016/j.mejo.2025.106674","DOIUrl":null,"url":null,"abstract":"<div><div>Physical unclonable function is considered a promising hardware security primitive for resource-constrained IoT devices. Arbiter PUF is one of the most well-known strong PUFs, which suffers from vulnerability to machine learning attacks and low reliability. In this paper, a high reliability and machine learning resistant cross-matrix (CM) arbiter PUF is proposed, which realizes the diversity of signal transmission paths through interstage cross structures, and adds inter row cross-feed loops between different arbiter PUFs to nonlinearized the circuit, which considerably enhances the resistance to machine learning attacks. A reliability enhancement model is also proposed to select the pair with the largest delay difference as the output from multiple delay paths, which significantly improves the reliability of CMAPUF. A mathematical model is developed to analyze the proposed CMAPUF and then we implement the circuit on Xilinx Artix-7 FPGA. The test results show that CMAPUF can effectively resist several widely used machine learning attacks with prediction accuracy below 60 % under 10<sup>6</sup> training samples, while its bit error rate (BER) at normal condition (1V, 25 °C) is 0.55 % and worst BER when the environmental change is 1.56 %.</div></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":"160 ","pages":"Article 106674"},"PeriodicalIF":1.9000,"publicationDate":"2025-04-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1879239125001237","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Physical unclonable function is considered a promising hardware security primitive for resource-constrained IoT devices. Arbiter PUF is one of the most well-known strong PUFs, which suffers from vulnerability to machine learning attacks and low reliability. In this paper, a high reliability and machine learning resistant cross-matrix (CM) arbiter PUF is proposed, which realizes the diversity of signal transmission paths through interstage cross structures, and adds inter row cross-feed loops between different arbiter PUFs to nonlinearized the circuit, which considerably enhances the resistance to machine learning attacks. A reliability enhancement model is also proposed to select the pair with the largest delay difference as the output from multiple delay paths, which significantly improves the reliability of CMAPUF. A mathematical model is developed to analyze the proposed CMAPUF and then we implement the circuit on Xilinx Artix-7 FPGA. The test results show that CMAPUF can effectively resist several widely used machine learning attacks with prediction accuracy below 60 % under 106 training samples, while its bit error rate (BER) at normal condition (1V, 25 °C) is 0.55 % and worst BER when the environmental change is 1.56 %.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.