Precursor Adsorption and Surface-Mediated Decomposition Mechanisms in BN Growth on Si(001): Implications for Low-κ Dielectric Materials

IF 5.3 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Roberto C. Longo*, Hirokazu Ueda and Peter L. G. Ventzek, 
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Abstract

The use of two-dimensional materials in the semiconductor industry is growing rapidly, showing promise for dramatically improving device performance. Among the wide range of 2D materials, BN is in the spotlight due to its potential use as an ideal substrate in graphene electronic devices or as intermetal and interlayer dielectric barrier with low-κ. Conventional approaches rely on BN transfer from the growth substrate, typically polycrystalline metals, to the corresponding substrate for characterization or device fabrication, a process not exempt from structural risks or contamination, because it implies the use of postprocessing techniques to obtain samples with the desired characteristics. Therefore, direct growth of BN on semiconductor or dielectric substrates is a necessity for the optimal performance of BN to become a reality. In this work, we use density-functional theory (DFT) and ab initio molecular dynamics (AIMD) to model chemical vapor deposition (CVD) and plasma enhanced CVD (PE-CVD) of a BN monolayer on silicon surfaces. In our simulations, single and multiple compound molecular precursors were modeled, selecting borazine (B3H6N3) and diborane/ammonia (B2H6/NH3) as model systems. Precursor decomposition during plasma-assisted processes determines to a large extent the growing modes of BN, but overall mechanisms for BN growth on semiconductor surfaces are complex and diverse, involving not only surface chemical reactions and kinetic effects but also dynamical effects such as strain-driven precursor dissociation or dissociative chemisorption pathways on surface sites next to a previously deposited molecular precursor. Our simulation results accurately describe not only the initial decomposition reactions and growth stages but also the electronic, thermodynamic, and vibrational signatures of the formed BN monolayer. Then, precursor-dependent bonding characteristics allow for the identification of experimentally measurable relevant properties such as infrared (IR) spectra or κ values, which will help optimize precursor usage and interpret the sometimes obscure experimental information, identifying specific measurements to the corresponding submonolayer BN bonding moieties.

Abstract Image

BN在Si上生长的前驱体吸附和表面介导的分解机制(001):对低κ介电材料的影响
二维材料在半导体工业中的应用正在迅速增长,并有望显著提高设备性能。在种类繁多的二维材料中,BN 因其可作为石墨烯电子器件的理想基底或低κ金属间和层间介质屏障而备受关注。传统方法依赖于将 BN 从生长基底(通常是多晶金属)转移到相应的基底上,以进行表征或器件制造,这一过程不免存在结构风险或污染,因为这意味着需要使用后处理技术来获得具有所需特性的样品。因此,在半导体或电介质基底上直接生长 BN 是实现 BN 最佳性能的必要条件。在这项工作中,我们使用密度泛函理论(DFT)和非初始分子动力学(AIMD)来模拟硅表面 BN 单层的化学气相沉积(CVD)和等离子体增强 CVD(PE-CVD)。在我们的模拟中,选择硼嗪(B3H6N3)和二硼烷/氨(B2H6/NH3)作为模型系统,对单个和多个化合物分子前驱体进行了建模。等离子体辅助过程中的前驱体分解在很大程度上决定了 BN 的生长模式,但 BN 在半导体表面生长的整体机制复杂多样,不仅涉及表面化学反应和动力学效应,还涉及应变驱动的前驱体解离或先前沉积的分子前驱体旁边的表面位点上的解离化学吸附途径等动力学效应。我们的模拟结果不仅准确描述了最初的分解反应和生长阶段,还准确描述了所形成的 BN 单层的电子、热力学和振动特征。然后,根据前驱体的成键特性,可以确定实验可测量的相关特性,如红外光谱或κ值,这将有助于优化前驱体的使用,并解释有时模糊不清的实验信息,确定相应的亚单层 BN 成键分子的具体测量值。
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来源期刊
CiteScore
8.30
自引率
3.40%
发文量
1601
期刊介绍: ACS Applied Nano Materials is an interdisciplinary journal publishing original research covering all aspects of engineering, chemistry, physics and biology relevant to applications of nanomaterials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials, engineering, physics, bioscience, and chemistry into important applications of nanomaterials.
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