Revealing Self-Driven Broadband Photodetection Using Heterojunction of Bi2Se3 and Low-Temperature Laser Molecular Beam Epitaxy Grown GaN on SrTiO3 (100) Substrate

IF 6.4 3区 材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY
Vishnu Aggarwal, Rahul Kumar, Sudhanshu Gautam, Aditya Yadav, Bipul Kumar Pradhan, Ramakrishnan Ganesan, Govind Gupta, M. Senthil Kumar, Sumeet Walia, Sunil Singh Kushvaha
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Abstract

Optoelectronic properties of GaN are underexplored on good lattice matching SrTiO3 (STO) due to STO's instability at the high GaN growth temperatures (800–1100 °C) required by traditional techniques. Here, GaN is grown on STO (100) at lower temperatures (500, 600, and 700 °C) using the laser-assisted molecular beam epitaxy (LMBE) technique, and their morphological, crystalline, optical, and photodetection properties are analyzed. Further, heterojunction of Bi2Se3 thin film (bandgap of 0.3 eV) is formed on the highest photo-responsive LMBE-GaN/STO to fabricate a self-powered broadband photodetector. The fabricated self-powered heterojunction photodetectors device exhibits a high responsivity of 2.93 × 102 mAW−1 in ultraviolet region and a notable responsivity of 2.3 and 12 mAW−1 in visible and near-infrared spectral regions, respectively. In addition, photoresponse properties of fabricated devices on bare LMBE-GaN and its heterojunction are compared under UV light illumination. The photoresponsivity of heterojunction in UV region is estimated to be 3.05 × 104 mAW−1, which is enhanced by 100% compared to bare LMBE-GaN. Combining the unique optoelectronic properties of GaN and rigidity of STO, epitaxy of GaN on STO enables construction of robust photodetector devices. Further, Bi2Se3-functionalized GaN can provide self-sufficient and high-quality futuristic optoelectronics devices.

Abstract Image

利用Bi2Se3异质结和SrTiO3(100)衬底上低温激光分子束外延生长GaN的自驱动宽带光探测
由于STO在传统技术要求的高GaN生长温度(800-1100°C)下不稳定,因此在良好晶格匹配的SrTiO3 (STO)上GaN的光电性能尚未得到充分的研究。本文利用激光辅助分子束外延(LMBE)技术,在低温(500、600和700℃)下在STO(100)上生长GaN,并分析了它们的形态、晶体、光学和光探测特性。此外,在光响应性最高的LMBE-GaN/STO上形成Bi2Se3薄膜异质结(带隙为0.3 eV),制备自供电宽带光电探测器。所制备的自供电异质结光电探测器在紫外区具有2.93 × 102 mAW−1的高响应率,在可见光和近红外区分别具有2.3和12 mAW−1的显著响应率。此外,还比较了制备器件在裸LMBE-GaN及其异质结上的光响应特性。异质结在紫外区的光响应率估计为3.05 × 104 mAW−1,与裸LMBE-GaN相比提高了100%。结合GaN独特的光电特性和STO的刚性,GaN外延在STO上可以构建坚固的光电探测器器件。此外,bi2se3功能化GaN可以提供自给自足和高质量的未来光电器件。
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来源期刊
Advanced Materials Technologies
Advanced Materials Technologies Materials Science-General Materials Science
CiteScore
10.20
自引率
4.40%
发文量
566
期刊介绍: Advanced Materials Technologies Advanced Materials Technologies is the new home for all technology-related materials applications research, with particular focus on advanced device design, fabrication and integration, as well as new technologies based on novel materials. It bridges the gap between fundamental laboratory research and industry.
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