A Modified Microwave Breakdown Threshold Prediction Method Based on Discontinuous Galerkin Approach

Abstract

Microwave devices are susceptible to high-power microwave breakdown effect, which seriously impacts the reliability of their integrated microwave systems, including electromagnetic communication stations and other electronic systems. To evaluate the high-power microwave breakdown characteristics of microwave devices, this article proposes a modified method for predicting the high-power microwave breakdown threshold. The proposed method considers the influence of more operating factors such as temperature, gas, and pulse shape by adjusting physical quantities like diffusion coefficient, adhesion rate, and pressure. Additionally, the newly modified equation can be efficiently solved using the discontinuous Galerkin approach, which has been already proved significant advantages in handling complex multiscale structures. Numerical examples demonstrate the remarkable accuracy and efficiency of the proposed method by comparing the calculated threshold with results from commercial software. We believe that this method provides an effective tool for predicting the breakdown threshold of microwave devices under various conditions, theoretically guiding the design of protection mechanisms for high-performance microwave components.