Dependence of the Optical Parameters of Spray-Deposited CdS:In Thin Films on Film Thickness

IF 2.1 4区 材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
JOM Pub Date : 2025-02-10 DOI:10.1007/s11837-025-07188-3
Shadia J. Ikhmayies
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引用次数: 0

Abstract

Indium-doped cadmium sulfide (CdS:In) thin films are important, especially for applications in solar cells. Optimization of optical properties is very important for high device performance, and film thickness is a significant factor affecting the optical parameters. In this work, thin films of CdS:In were deposited by spray pyrolysis (SP) technique on glass substrates at substrate temperature Ts = 490°C. The films were characterized using X-ray diffraction (XRD), scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM-EDX), and ultraviolet-visible (UV-vis) spectroscopy. The films presented a polycrystalline structure and mixed (cubic and hexagonal) phase. The transmittance of the films was measured at room temperature and used to deduce the optical parameters: absorption coefficient, extinction coefficient, refractive index, the real and imaginary parts of the dielectric constant, and the energy loss. A redshift of the absorption edge, which increases with film thickness, was observed. It was found that the extinction coefficient and energy loss decrease with film thickness, while the refractive index increases with film thickness, and this increase becomes faster with decreasing wavelength of incident light. The real and imaginary parts of the dielectric constant showed fluctuations with film thickness, depending on interference maxima and minima in the transmittance spectra.

喷涂沉积cd薄膜光学参数与薄膜厚度的关系
铟掺杂硫化镉(CdS:In)薄膜是重要的,特别是在太阳能电池中的应用。光学性能的优化对于器件的高性能是非常重要的,而薄膜厚度是影响光学参数的重要因素。在这项工作中,采用喷雾热解(SP)技术在衬底温度Ts = 490℃的玻璃衬底上沉积了CdS:In薄膜。采用x射线衍射(XRD)、扫描电镜-能量色散x射线能谱(SEM-EDX)和紫外-可见(UV-vis)光谱对膜进行了表征。薄膜呈现多晶结构和混合(立方和六方)相。在室温下测量薄膜的透射率,并以此推导出光学参数:吸收系数、消光系数、折射率、介电常数的实部和虚部以及能量损失。观察到吸收边的红移随薄膜厚度的增加而增加。消光系数和能量损失随膜厚的增大而减小,折射率随膜厚的增大而增大,且随入射光波长的减小而增大。介电常数的实部和虚部随薄膜厚度的变化而波动,这取决于透射光谱中的干涉最大值和最小值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
JOM
JOM 工程技术-材料科学:综合
CiteScore
4.50
自引率
3.80%
发文量
540
审稿时长
2.8 months
期刊介绍: JOM is a technical journal devoted to exploring the many aspects of materials science and engineering. JOM reports scholarly work that explores the state-of-the-art processing, fabrication, design, and application of metals, ceramics, plastics, composites, and other materials. In pursuing this goal, JOM strives to balance the interests of the laboratory and the marketplace by reporting academic, industrial, and government-sponsored work from around the world.
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