{"title":"Evaluating Time Occupancy and Time-Scales in Interference Testing With Pulse-Modulated Noise","authors":"Michelle Pirrone;Aric Sanders;Adam Wunderlich","doi":"10.1109/TEMC.2025.3552044","DOIUrl":null,"url":null,"abstract":"We present experimental results investigating the utility of pulse-modulated noise (PMN) for general-purpose, systematic interference testing. Time-domain interference vulnerabilities are examined by modifying the PMN duty cycle, which controls time occupancy, and the PMN period, which modifies the time-scale. The PMN waveform class that we utilize depends on only two parameters, making it far simpler than real-world communication signals and easier to generate. We perform experimentation with a conducted interference testbed that uses a consumer off-the-shelf IEEE 802.11n wireless local area network Wi-Fi link as the victim system. Comparisons are also made between PMN and measured long-term evolution (LTE) and Wi-Fi signals of corresponding time occupancies to assess if realistic interference impacts are generated by PMN. We find that time occupancy is a strong predictor of interference impacts, but that time-scale and time correlations can also be relevant factors in some circumstances. Overall, our findings support PMN as a useful class of artificial test waveforms for interference testing that can be used to characterize a wide range of interference vulnerabilities on a bidirectional communication link.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 4","pages":"1116-1128"},"PeriodicalIF":2.5000,"publicationDate":"2025-04-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electromagnetic Compatibility","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10964434/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
We present experimental results investigating the utility of pulse-modulated noise (PMN) for general-purpose, systematic interference testing. Time-domain interference vulnerabilities are examined by modifying the PMN duty cycle, which controls time occupancy, and the PMN period, which modifies the time-scale. The PMN waveform class that we utilize depends on only two parameters, making it far simpler than real-world communication signals and easier to generate. We perform experimentation with a conducted interference testbed that uses a consumer off-the-shelf IEEE 802.11n wireless local area network Wi-Fi link as the victim system. Comparisons are also made between PMN and measured long-term evolution (LTE) and Wi-Fi signals of corresponding time occupancies to assess if realistic interference impacts are generated by PMN. We find that time occupancy is a strong predictor of interference impacts, but that time-scale and time correlations can also be relevant factors in some circumstances. Overall, our findings support PMN as a useful class of artificial test waveforms for interference testing that can be used to characterize a wide range of interference vulnerabilities on a bidirectional communication link.
期刊介绍:
IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.