{"title":"Study of TID & dose rate effect of gamma radiation on COTS CMOS camera","authors":"Manish Kumar Tiwari , Jyoti Diwan , S.K. Singh , C.A. Betty","doi":"10.1016/j.nimb.2025.165700","DOIUrl":null,"url":null,"abstract":"<div><div>Commercially available CMOS cameras suffer from gamma radiation-induced total ionizing dose (TID) effect and transient effect in nuclear surveillance applications where radiation dose is very high. TID effects are those observable effects that do not disappear soon after the removal of the radiation source, whereas transient effects appear after the incident of gamma photons and the camera returns to a normal state soon. In this paper, we have presented gamma irradiation results of CMOS APS cameras using a Co-60 source. We have investigated the TID effect on the transient response of CMOS cameras due to gamma radiation. We have irradiated a camera at three different dose rates with a TID of 37 krad and another camera at 10 krad/hr for 40 krad TID. We have used image analysis techniques to find the TID effect and the transient effect. First, we have presented the TID effect due to gamma irradiation. Subsequently, we have presented the dose rate effect of gamma radiation and discussed the TID effect on the dose rate dependent transient response of the cameras. We have observed an increase in dark signal, dark signal non-uniformity and temporal noise as the TID effect and the snow effect as a transient effect. We have not found an observable effect on the transient response of the camera due to TID. The analysis techniques and results presented in this paper are useful in applications where cameras are used as radiation monitors, in surveillance and remote inspection applications.</div></div>","PeriodicalId":19380,"journal":{"name":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","volume":"563 ","pages":""},"PeriodicalIF":1.4000,"publicationDate":"2025-04-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0168583X25000904","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0
Abstract
Commercially available CMOS cameras suffer from gamma radiation-induced total ionizing dose (TID) effect and transient effect in nuclear surveillance applications where radiation dose is very high. TID effects are those observable effects that do not disappear soon after the removal of the radiation source, whereas transient effects appear after the incident of gamma photons and the camera returns to a normal state soon. In this paper, we have presented gamma irradiation results of CMOS APS cameras using a Co-60 source. We have investigated the TID effect on the transient response of CMOS cameras due to gamma radiation. We have irradiated a camera at three different dose rates with a TID of 37 krad and another camera at 10 krad/hr for 40 krad TID. We have used image analysis techniques to find the TID effect and the transient effect. First, we have presented the TID effect due to gamma irradiation. Subsequently, we have presented the dose rate effect of gamma radiation and discussed the TID effect on the dose rate dependent transient response of the cameras. We have observed an increase in dark signal, dark signal non-uniformity and temporal noise as the TID effect and the snow effect as a transient effect. We have not found an observable effect on the transient response of the camera due to TID. The analysis techniques and results presented in this paper are useful in applications where cameras are used as radiation monitors, in surveillance and remote inspection applications.
期刊介绍:
Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.