Increasing Precision of Impedance Measurements for ESD Protection's Frequency Models

IF 2.5 3区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
François Ruffat;Fabrice Caignet;Alexandre Boyer;Guillaume Mejecaze;Frédéric Puybaret;Fabien Escudié
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引用次数: 0

Abstract

Achieving system level ESD robustness by simulation required the use of precise models that should take into account the triggering behavior of the protections. This article upgrades articles dealing with frequency measurement methods to get the equivalent impedance of ESD protections exposed to strong pulses (Escudié et al., 2022, Ruffat et al., 2022, Caignet et al., 2022). In this article, a two-port transmission measurement is used to increase the accuracy of measurement for very low or high impedance values of this type of protections. The pros and cons of one-port versus two-port measurements are presented, showing how the precision is increased. Some experimental results on commercial transient voltage suppressor are proposed and discussed. To conclude this article, different models also built from frequency measurements are introduced and compared.
提高ESD保护频率模型的阻抗测量精度
通过仿真实现系统级ESD稳健性需要使用精确的模型,这些模型应该考虑到保护的触发行为。本文对有关频率测量方法的文章进行了升级,得到了强脉冲下ESD保护的等效阻抗(escudi等人,2022;Ruffat等人,2022;Caignet等人,2022)。在本文中,使用双端口传输测量来提高这种类型保护的非常低或高阻抗值的测量精度。介绍了单端口与双端口测量的优缺点,并展示了如何提高精度。提出并讨论了商用暂态电压抑制器的一些实验结果。最后,介绍并比较了基于频率测量建立的不同模型。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
4.80
自引率
19.00%
发文量
235
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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