Rigoberto Juarez-Salazar , Fabio Vega , Sofia Esquivel-Hernandez , Victor H. Diaz-Ramirez , Andres G. Marrugo
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引用次数: 0
Abstract
Diffuse objects have suitable optical properties for accurate three-dimensional reconstruction by fringe projection profilometry. In contrast, shiny objects, such as glossy plastic items and metallic workpieces, are difficult to reconstruct due to image saturation. In this paper, the recursive structure of the hierarchical multi-frequency fringe projection profilometry is exploited to prevent saturation by a feedback loop. Novel functions for saturation, low-modulation, and grating intensity correction, suited to adjust the projector pixels inducing saturation, are proposed. The usefulness of the proposal is verified experimentally, confirming the high performance of the proposed phase feedback approach for the reconstruction of shiny objects.
期刊介绍:
Optics and Lasers in Engineering aims at providing an international forum for the interchange of information on the development of optical techniques and laser technology in engineering. Emphasis is placed on contributions targeted at the practical use of methods and devices, the development and enhancement of solutions and new theoretical concepts for experimental methods.
Optics and Lasers in Engineering reflects the main areas in which optical methods are being used and developed for an engineering environment. Manuscripts should offer clear evidence of novelty and significance. Papers focusing on parameter optimization or computational issues are not suitable. Similarly, papers focussed on an application rather than the optical method fall outside the journal''s scope. The scope of the journal is defined to include the following:
-Optical Metrology-
Optical Methods for 3D visualization and virtual engineering-
Optical Techniques for Microsystems-
Imaging, Microscopy and Adaptive Optics-
Computational Imaging-
Laser methods in manufacturing-
Integrated optical and photonic sensors-
Optics and Photonics in Life Science-
Hyperspectral and spectroscopic methods-
Infrared and Terahertz techniques