Deep learning assisted high-resolution microscopy image processing for phase segmentation in functional composite materials.

IF 1.5 4区 工程技术 Q3 MICROSCOPY
Ganesh Raghavendran, Bing Han, Fortune Adekogbe, Shuang Bai, Bingyu Lu, William Wu, Minghao Zhang, Ying Shirley Meng
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引用次数: 0

Abstract

In the domain of battery research, the processing of high-resolution microscopy images is a challenging task, as it involves dealing with complex images and requires a prior understanding of the components involved. The utilisation of deep learning methodologies for image analysis has attracted considerable interest in recent years, with multiple investigations employing such techniques for image segmentation and analysis within the realm of battery research. However, the automated analysis of high-resolution microscopy images for detecting phases and components in composite materials is still an underexplored area. This work proposes a novel workflow for FFT-based segmentation, periodic component detection and phase segmentation from raw high-resolution Transmission Electron Microscopy (TEM) images using a trained U-Net segmentation model. The developed model can expedite the detection of components and their phase segmentation, diminishing the temporal and cognitive demands associated with scrutinising an extensive array of TEM images, thereby mitigating the potential for human errors. This approach presents a novel and efficient image analysis approach with broad applicability beyond the battery field and holds potential for application in other related domains characterised by phase and composition distribution, such as alloy production.

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来源期刊
Journal of microscopy
Journal of microscopy 工程技术-显微镜技术
CiteScore
4.30
自引率
5.00%
发文量
83
审稿时长
1 months
期刊介绍: The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit. The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens. Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.
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