Improved Circular Edge Analysis Method for Measuring the Focus Size and Shape in High-Energy Electron Accelerator

IF 5.6 2区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Fengxiao Li;Guowei Zhong;Haijun Yu;Rifeng Zhou
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引用次数: 0

Abstract

To achieve high spatial resolution of X-ray imaging, the focal spot size of high-energy nondestructive testing electron accelerators has been progressively reduced from 2 to below 1 mm, and, in some cases, down to tens of micrometers. To measure these increasingly smaller focal spots, traditional methods such as the “Sandwich” test method and the slit translation scanning method are no longer effective. This article developed an improved circular edge analysis method (ICEAM) for measuring the size and shape of the focal spot of electron accelerators. The ICEAM employs the detector’s point spread function (PSF) to correct the nonideal circular aperture image caused by the X-ray scatter and the detector’s crosstalk. Then, edge spread functions (ESFs) of the corrected circular aperture image are used to construct a sinogram of the focal spot, which is subsequently used to reconstruct the intensity distribution image of the focal spot by using the filtered back-projection (FBP) method. This approach enables precise measurement of both the shape and the size of the focal spot. Theoretical and experimental results demonstrate that ICEAM can not only conveniently and rapidly measure the shape and size of focal spots for conventional high-energy electron accelerators, with measurement errors within 5.8%, but also accurately measure the micrometer-scale focal spots for novel MeV energy electron accelerators (Rhodotron), with measurement errors within 16.2% of the theoretical value. The proposed ICEAM effectively tackles the challenges in measuring the shape and size of the microfocus for novel high-energy electron accelerators, and it is of significant importance for advancing the application of these electron accelerators in digital X-ray imaging and high-end equipment such as industrial CT.
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来源期刊
IEEE Transactions on Instrumentation and Measurement
IEEE Transactions on Instrumentation and Measurement 工程技术-工程:电子与电气
CiteScore
9.00
自引率
23.20%
发文量
1294
审稿时长
3.9 months
期刊介绍: Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.
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