Synthesis, polarization currents, dielectric constant, and stability of magnesium titanate-based ceramics

Abstract

The synthesis of magnesium titanate (MgTiO₃)-based ceramics via high-temperature solid-state reactions between MgO and TiO₂ has unlocked a pathway to achieving desirable crystalline structures and exceptional dielectric properties. This study introduces an innovative approach by leveraging the electroluminescence current technique to measure polarization currents in MgTiO₃-based ceramics, offering a more precise and insightful analysis of their behavior. It further pioneers an investigation into how sample dimensions, particularly thickness and diameter, influence key dielectric properties such as capacitance, permittivity, insulation resistance, and losses under varying temperatures and voltages. Advanced characterization methods, including X-ray diffraction (XRD), were employed to unveil the phase composition and microstructure. At the same time, dielectric measurements demonstrated groundbreaking findings: capacitance decreases with increasing thickness, shifting from 22.86 pF for a 4.38 mm sample to 21.80 pF for a 3.21 mm sample. Remarkably, the dielectric constant, ranging from 16.2 to 17.1 across 0 to 140 °C, showed a clear dependence on film thickness. Furthermore, capacitance exhibited stability across temperature variations, highlighting the material's robust performance. A significant link was observed between the dimensions of the samples and their dielectric behavior, creating a reliable database for simulating the properties of MgTiO₃ ceramics under various conditions. The findings enhance our understanding of how microstructural factors affect dielectric performance, facilitating the further development of MgTiO₃-based ceramics for advanced electronic applications.