Surface Electric Field Measurement of Composite Insulator Using an Optical Waveguide Sensor

IF 2.9 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Jiahong Zhang;Weichang Li;Jiali Shi;Jing Zhang
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Abstract

In this article, an integrated optical waveguide sensor is designed and developed to comprehensively analyze the surface electric field distribution characteristics of composite insulators. Based on the optical waveguide electric field sensor, an experimental system is set up for measuring the axial and radial electric fields along the surface of composite insulators under normal, damaged, and internally defective conditions. The experimental results show that when a 10kV power frequency voltage is connected, the radial and axial electric fields at the low and high voltage (HV) ends of the normal insulator are 21.53, 53.07 kV/m and 47.55, 105.12 kV/m, respectively. When the insulator surface is damaged, the radial and axial electric field intensities at the damaged locations increase by 37.59%–204.85% and 12.89%–32.69%, respectively. When an internal defect occurred, the radial and axial electric fields along the defect area increase by 18% and decrease by 127.72%, respectively. The radial electric field is more affected by the defect. The comparison with the calculation results shows that the integrated optical waveguide electric field sensor has great potential capability to be used for measuring the surface electric field of insulators.
本文设计并开发了一种集成光波导传感器,用于全面分析复合绝缘子的表面电场分布特征。在光波导电场传感器的基础上,建立了一套实验系统,用于测量复合绝缘子在正常、损坏和内部缺陷条件下沿表面的轴向和径向电场。实验结果表明,当连接 10kV 工频电压时,正常绝缘体低压端和高压端(HV)的径向和轴向电场分别为 21.53、53.07 kV/m 和 47.55、105.12 kV/m。当绝缘体表面受损时,受损位置的径向和轴向电场强度分别增加 37.59%-204.85% 和 12.89%-32.69%。当发生内部缺陷时,沿缺陷区域的径向和轴向电场分别增加 18% 和减少 127.72%。径向电场受缺陷的影响更大。与计算结果的比较表明,集成光波导电场传感器在测量绝缘体表面电场方面具有巨大的潜在能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Transactions on Dielectrics and Electrical Insulation
IEEE Transactions on Dielectrics and Electrical Insulation 工程技术-工程:电子与电气
CiteScore
6.00
自引率
22.60%
发文量
309
审稿时长
5.2 months
期刊介绍: Topics that are concerned with dielectric phenomena and measurements, with development and characterization of gaseous, vacuum, liquid and solid electrical insulating materials and systems; and with utilization of these materials in circuits and systems under condition of use.
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