{"title":"Breakdown Characteristics and Damage Mechanism of Typical Defects in Oil-Paper Insulation Under HEMP","authors":"Feng Qin;Simeng Li;Wei Chen;Zhitong Cui;Xin Nie;Wei Wu","doi":"10.1109/TDEI.2024.3479129","DOIUrl":null,"url":null,"abstract":"High-altitude electromagnetic pulses (HEMPs) can couple with power transmission and distribution lines, creating a nanosecond-level HEMP conductive environment that can degrade the insulation performance and even cause breakdown of distribution transformers, posing a threat to the safe operation of power systems. In this article, based on the main vulnerable parts identified in HEMP effect tests on distribution transformers, a typical defect model of oil-paper insulation was constructed, and an experimental platform was set up to study the breakdown characteristics of oil-paper insulation under HEMP. The process of charge accumulation was analyzed using finite element simulation, revealing the damage mechanism of oil-paper insulation under HEMP and other nanosecond pulses. The results show that the breakdown characteristics of oil-paper insulation under HEMP have a significant polarity effect, which is related to the accumulation of charges at the interface of oil-paper insulation. The accumulation of charges at the interface of oil-paper insulation is comparable to the nanosecond rise time of the HEMP waveform, resulting in a certain balance relationship in the location of breakdown points. Under negative-polarity HEMP, needle-plate defect structures have a higher proportion of breakdown at the trailing edge of the waveform, indicating that the energy provided within the rise time of the HEMP waveform is slightly insufficient.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 2","pages":"1046-1055"},"PeriodicalIF":2.9000,"publicationDate":"2024-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Dielectrics and Electrical Insulation","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10714454/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
High-altitude electromagnetic pulses (HEMPs) can couple with power transmission and distribution lines, creating a nanosecond-level HEMP conductive environment that can degrade the insulation performance and even cause breakdown of distribution transformers, posing a threat to the safe operation of power systems. In this article, based on the main vulnerable parts identified in HEMP effect tests on distribution transformers, a typical defect model of oil-paper insulation was constructed, and an experimental platform was set up to study the breakdown characteristics of oil-paper insulation under HEMP. The process of charge accumulation was analyzed using finite element simulation, revealing the damage mechanism of oil-paper insulation under HEMP and other nanosecond pulses. The results show that the breakdown characteristics of oil-paper insulation under HEMP have a significant polarity effect, which is related to the accumulation of charges at the interface of oil-paper insulation. The accumulation of charges at the interface of oil-paper insulation is comparable to the nanosecond rise time of the HEMP waveform, resulting in a certain balance relationship in the location of breakdown points. Under negative-polarity HEMP, needle-plate defect structures have a higher proportion of breakdown at the trailing edge of the waveform, indicating that the energy provided within the rise time of the HEMP waveform is slightly insufficient.
期刊介绍:
Topics that are concerned with dielectric phenomena and measurements, with development and characterization of gaseous, vacuum, liquid and solid electrical insulating materials and systems; and with utilization of these materials in circuits and systems under condition of use.