Pulse Charging–Discharging Behavior and Reliability Analysis of Antiferroelectric MLCCs

Abstract

In this research, the pulse charging-discharging behavior and reliability of antiferroelectric multilayer ceramic capacitors (AFE MLCCs) were investigated. The results revealed that as the voltage stress increased gradually from 900 to 1400 V, the characteristic lifetime of AFE MLCCs exhibited a monotonically decreasing trend, and this downward trend conforms to an inverse power law. However, experimental findings reveal that the discharge lifetime of AFE MLCCs is longer at higher temperatures. Moreover, the relationship between lifetime and temperature stress no longer follows the Arrhenius accelerated model, which may be attributed to the different phase transition behaviors of AFE MLCC at elevated temperatures. By observing the results at high temperatures, it was found that the polarization of AFE MLCC significantly decreased, leading to a reduction in its stored energy density and discharge current. Furthermore, high temperatures also decreased the strain caused by structural transitions in AFE MLCC, indicating a more complex influence of temperature on the phase transition behavior of AFE materials. Finally, microfailures of AFE MLCC were observed, and the failure mechanism was analyzed, categorizing it into three types. In addition, it was noted that due to the phase transition behavior of AFE materials and the inherent complex internal structure of MLCC, the breakdown failure of AFE MLCC is a complex mechanical-electrical–thermal coupling phenomenon, which needs to be a key point for future practical applications of AFE MLCCs.