Experiment and Simulation of Temperature Effects on Partial Discharge and Electrical Treeing in XLPE Insulation

IF 2.9 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Yan Li;Yu Shan;Guancheng Zhen;Lingyuan Lan;Yunpeng Liu;Xiangrui Zeng;Bowen Liu
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Abstract

Crosslinked polyethylene (XLPE) is a crucial insulating material for cables. Partial discharge (PD) and electrical treeing are key parameters for characterizing the state of XLPE. Studies have found that the temperature affects the PD and electrical treeing of XLPE. Yet, the theoretical analysis of this phenomenon is not sufficiently elaborated in-depth. To address this, this article constructs a testing platform for XLPE PD and electrical treeing, observing the development patterns of PD and electrical treeing at $50~^{\circ }$ C, $70~^{\circ }$ C, and $90~^{\circ }$ C. Experiments indicate that rising temperatures result in lower inception voltages for PDs, more frequent discharges, faster electrical tree growth, and a reduction in branching. To explore the theoretical mechanism behind the impact of temperature, this article first calculates the conductivity of cavities under different temperature conditions on a microscale using a fluid simulation model and measures the dielectric constant of XLPE at various temperatures. Then, combining a macroscale finite element simulation model, the effect of temperature on the frequency of PD occurrences is analyzed through multiscale simulation analysis. Subsequently, considering the effects of dielectric constant, critical breakdown strength, and dielectric loss tan $\delta $ at different temperatures, the phase field model is used to depict the growth of electrical trees under various temperatures. Ultimately, the simulation results show that an increase in temperature leads to a lower discharge field strength, an increase in the number of PDs, a faster growth rate of electrical trees, and a reduction in branching, which corresponds to and explains the experimental results. Temperature dependency of dielectric constant and critical breakdown strength are the key factors for the PD and electrical tree development patterns under different temperatures separately.
温度对交联聚乙烯绝缘局部放电和电气树形影响的实验与仿真
交联聚乙烯(XLPE)是电缆的重要绝缘材料。局部放电(PD)和电气树是表征XLPE状态的关键参数。研究发现,温度对交联聚乙烯的PD和电树有影响。然而,对这一现象的理论分析还不够深入。为了解决这一问题,本文构建了XLPE PD和电树的测试平台,观察了$50~^{\circ}$ C、$70~^{\circ}$ C和$90~^{\circ}$ C下PD和电树的发育模式。实验表明,温度升高导致PD的起始电压降低,放电频率增加,电树生长速度加快,分支减少。为了探究温度影响的理论机制,本文首先利用流体模拟模型在微尺度上计算了不同温度条件下空腔的电导率,并测量了XLPE在不同温度下的介电常数。然后,结合宏观尺度有限元模拟模型,通过多尺度模拟分析,分析温度对局部放电发生频率的影响。然后,考虑不同温度下介电常数、临界击穿强度和介电损耗tan $\delta $的影响,采用相场模型描述了不同温度下电树的生长情况。最终,仿真结果表明,温度升高导致放电场强降低,pd数增加,电树生长速度加快,分支减少,这与实验结果相对应并解释了实验结果。介电常数和临界击穿强度的温度依赖性分别是影响PD和电树在不同温度下发育模式的关键因素。
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来源期刊
IEEE Transactions on Dielectrics and Electrical Insulation
IEEE Transactions on Dielectrics and Electrical Insulation 工程技术-工程:电子与电气
CiteScore
6.00
自引率
22.60%
发文量
309
审稿时长
5.2 months
期刊介绍: Topics that are concerned with dielectric phenomena and measurements, with development and characterization of gaseous, vacuum, liquid and solid electrical insulating materials and systems; and with utilization of these materials in circuits and systems under condition of use.
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