{"title":"Detection Model for Automatic Defect Quantification and Segmentation for Stepped Eddy Current Thermography","authors":"Yuan Gao;Liang Zhang;Zheng Liang;Ting Zheng;Xiong Deng;Xin Chen","doi":"10.1109/JSEN.2025.3542091","DOIUrl":null,"url":null,"abstract":"The stepped eddy current thermography (SECT) nondestructive testing (NDT) technique is characterized by long heating time and nonuniform temperature rise. This causes it to remain challenging to quantify the geometrical features of defects on the inner wall of the tank roof and the outer wall of the tank bottom in oil and gas storage tanks. This article proposes a combined model for compressing and reconstructing thermal image sequences: the skewness model combined with the improved Gaussian adaptive background estimation algorithm (SM-IGABEA) for quantifying the defect morphology. The combined model is coupled with the first-order differential max-min method to quantify the width and height of defects accurately. The combined model combined with the first-order differential mean method can accurately segment defects. A mathematical model for predicting the residual depth (RD) of steel plates is developed to describe the relationship between the geometric characteristics of defects and the mean value of skewness. Finally, the generalization of SM-IGABEA is verified by elliptical defects. The results show that various combinatorial models and quantization methods are proposed for the defect measurement task. The measurement accuracy and stability of SM-IGABEA significantly outperform the mainstream compressive reconstruction algorithms.","PeriodicalId":447,"journal":{"name":"IEEE Sensors Journal","volume":"25 7","pages":"10784-10799"},"PeriodicalIF":4.3000,"publicationDate":"2025-02-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Sensors Journal","FirstCategoryId":"103","ListUrlMain":"https://ieeexplore.ieee.org/document/10899750/","RegionNum":2,"RegionCategory":"综合性期刊","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The stepped eddy current thermography (SECT) nondestructive testing (NDT) technique is characterized by long heating time and nonuniform temperature rise. This causes it to remain challenging to quantify the geometrical features of defects on the inner wall of the tank roof and the outer wall of the tank bottom in oil and gas storage tanks. This article proposes a combined model for compressing and reconstructing thermal image sequences: the skewness model combined with the improved Gaussian adaptive background estimation algorithm (SM-IGABEA) for quantifying the defect morphology. The combined model is coupled with the first-order differential max-min method to quantify the width and height of defects accurately. The combined model combined with the first-order differential mean method can accurately segment defects. A mathematical model for predicting the residual depth (RD) of steel plates is developed to describe the relationship between the geometric characteristics of defects and the mean value of skewness. Finally, the generalization of SM-IGABEA is verified by elliptical defects. The results show that various combinatorial models and quantization methods are proposed for the defect measurement task. The measurement accuracy and stability of SM-IGABEA significantly outperform the mainstream compressive reconstruction algorithms.
期刊介绍:
The fields of interest of the IEEE Sensors Journal are the theory, design , fabrication, manufacturing and applications of devices for sensing and transducing physical, chemical and biological phenomena, with emphasis on the electronics and physics aspect of sensors and integrated sensors-actuators. IEEE Sensors Journal deals with the following:
-Sensor Phenomenology, Modelling, and Evaluation
-Sensor Materials, Processing, and Fabrication
-Chemical and Gas Sensors
-Microfluidics and Biosensors
-Optical Sensors
-Physical Sensors: Temperature, Mechanical, Magnetic, and others
-Acoustic and Ultrasonic Sensors
-Sensor Packaging
-Sensor Networks
-Sensor Applications
-Sensor Systems: Signals, Processing, and Interfaces
-Actuators and Sensor Power Systems
-Sensor Signal Processing for high precision and stability (amplification, filtering, linearization, modulation/demodulation) and under harsh conditions (EMC, radiation, humidity, temperature); energy consumption/harvesting
-Sensor Data Processing (soft computing with sensor data, e.g., pattern recognition, machine learning, evolutionary computation; sensor data fusion, processing of wave e.g., electromagnetic and acoustic; and non-wave, e.g., chemical, gravity, particle, thermal, radiative and non-radiative sensor data, detection, estimation and classification based on sensor data)
-Sensors in Industrial Practice