Normalized Field Product Approach: A Parameter-Free Density Evaluation Method for Close-To-Binary Solutions in Topology Optimization With Embedded Length Scale

IF 2.7 3区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY
Nikhil Singh, Prabhat Kumar, Anupam Saxena
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引用次数: 0

Abstract

This article provides a normalized field product approach for topology optimization to achieve close-to-binary optimal designs. The method uses a parameter-free density measure that enforces a specified minimum length scale on the solid phase, ensuring smooth and transition-free topologies. The density evaluation does not rely on weight functions; however, the associated density functions are required to confined between 0 and 1. The method combines the SIMP scheme with the introduced density function for material stiffness interpolation. The success and efficacy of the approach are demonstrated through the design of both two- and three-dimensional designs, including stiff structures and compliant mechanisms. The structure's compliance is minimized for the former, whereas the latter involves optimizing a multicriteria objective. The presented numerical examples consider different volume fractions, length scales, and density functions. The proposed method is also seamlessly extended with advanced elements for solving 3D problems. The optimized designs obtained are close to binary without any user intervention while satisfying the desired feature size on the solid phase.

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来源期刊
CiteScore
5.70
自引率
6.90%
发文量
276
审稿时长
5.3 months
期刊介绍: The International Journal for Numerical Methods in Engineering publishes original papers describing significant, novel developments in numerical methods that are applicable to engineering problems. The Journal is known for welcoming contributions in a wide range of areas in computational engineering, including computational issues in model reduction, uncertainty quantification, verification and validation, inverse analysis and stochastic methods, optimisation, element technology, solution techniques and parallel computing, damage and fracture, mechanics at micro and nano-scales, low-speed fluid dynamics, fluid-structure interaction, electromagnetics, coupled diffusion phenomena, and error estimation and mesh generation. It is emphasized that this is by no means an exhaustive list, and particularly papers on multi-scale, multi-physics or multi-disciplinary problems, and on new, emerging topics are welcome.
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