Tyler N. Tallman, Danny Smyl, Laura Homa, John Wertz
{"title":"The Effect of Different Regularization Approaches on Damage Imaging via Electrical Impedance Tomography","authors":"Tyler N. Tallman, Danny Smyl, Laura Homa, John Wertz","doi":"10.1007/s10921-025-01178-w","DOIUrl":null,"url":null,"abstract":"<div><p>Electrical impedance tomography (EIT) has attracted attention for its potential application to nondestructive evaluation of materials due to a lack of ionizing radiation, low cost, and the potential for integration with the material system. However, EIT is an ill-posed inverse problem and requires regularization to achieve a physically meaningful solution. Many materials-based practitioners of EIT make use of relatively simple regularization methods. This is important because the choice of the regularizer <i>significantly</i> impacts final image quality. Choosing poorly can misrepresent the damage state of the material to the inspector, ultimately undermining the potential of this modality. This manuscript thus serves as a primer for researchers using EIT for damage detection and localization by applying several common regularization techniques and one new technique to six experimental data sets. Notably, experimental data is taken from components of representative complexity and/or subject to non-trivial loading or realistic damage in an effort to transition the research away from the overly-simplified shapes and conditions that permeate the current state-of-the-art. It is shown that there is no one-size-fits-all regularization method; materials-based EIT practitioners must guide selection of the appropriate regularization method with knowledge of what they intend to image.</p></div>","PeriodicalId":655,"journal":{"name":"Journal of Nondestructive Evaluation","volume":"44 2","pages":""},"PeriodicalIF":2.6000,"publicationDate":"2025-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Nondestructive Evaluation","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1007/s10921-025-01178-w","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, CHARACTERIZATION & TESTING","Score":null,"Total":0}
引用次数: 0
Abstract
Electrical impedance tomography (EIT) has attracted attention for its potential application to nondestructive evaluation of materials due to a lack of ionizing radiation, low cost, and the potential for integration with the material system. However, EIT is an ill-posed inverse problem and requires regularization to achieve a physically meaningful solution. Many materials-based practitioners of EIT make use of relatively simple regularization methods. This is important because the choice of the regularizer significantly impacts final image quality. Choosing poorly can misrepresent the damage state of the material to the inspector, ultimately undermining the potential of this modality. This manuscript thus serves as a primer for researchers using EIT for damage detection and localization by applying several common regularization techniques and one new technique to six experimental data sets. Notably, experimental data is taken from components of representative complexity and/or subject to non-trivial loading or realistic damage in an effort to transition the research away from the overly-simplified shapes and conditions that permeate the current state-of-the-art. It is shown that there is no one-size-fits-all regularization method; materials-based EIT practitioners must guide selection of the appropriate regularization method with knowledge of what they intend to image.
期刊介绍:
Journal of Nondestructive Evaluation provides a forum for the broad range of scientific and engineering activities involved in developing a quantitative nondestructive evaluation (NDE) capability. This interdisciplinary journal publishes papers on the development of new equipment, analyses, and approaches to nondestructive measurements.