Analysis of impurities in NaPF6 for sodium-ion batteries by inductively coupled plasma tandem mass spectrometry

IF 3.2 2区 化学 Q1 SPECTROSCOPY
Ping Li , Shuiai Luo , Liang Fu , Dan Sun , Song Lan , Shuchun Li
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引用次数: 0

Abstract

To detect metal impurities in the electrolyte of sodium-ion batteries (sodium hexafluorophosphate, NaPF6) and ensure the performance stability and safety of sodium-ion batteries, a new strategy for identifying detrimental metal impurities is proposed. In this work, inductively coupled plasma tandem mass spectrometry (ICP-MS/MS) was used to study 12 metal impurities in NaPF6. The NaPF6 sample was dissolved in ultra-pure water and directly analyzed by ICP-MS/MS, and the spectral interference was eliminated by the reaction gas mixture N2O/H2 in the MS/MS mode. The analysis results were compared with the results from sector field (SF)-ICP-MS, and the accuracy and reliability of the developed method were evaluated by a spike recovery test. Under optimized conditions, the limit of detection (LOD) of analytes was in the range of 0.16–3.2 ng L−1, the spiked recovery was in the range of 94.4 %–105 %, and the relative standard deviation (RSD) was 1.3 %–4.1 %. Statistical analysis showed that, at the confidence level of 95 %, there was no significant difference between the analysis results from the developed method and SF-ICP-MS. The developed method is accurate and reliable, with good stability and high accuracy. The ICP-MS/MS method based on the N2O/H2 reaction mode shows strong potential for analyzing various metal impurities in NaPF6, and can be extended to other fields with great reference value.

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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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