An 8-bit 1.16 mw 500 ms/s SAR ADC with bidirectional-bit-distribution-based offset calibration and partially activated accelerating current source

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Min Lin, Pengjun He, Jinpeng Tian
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引用次数: 0

Abstract

This paper presents an 8-bit 500MS/s single-channel Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC). It features: 1) a fast-converging bidirectional-bit-distribution-based (BBDB) ping-pong comparator calibration, which bidirectionally adjusts the offset of the two comparators to their mean values, and reduces the offset standard deviation to 0.707 times initial offset value; and 2) the use of partially activated accelerating current source (ACS), depending on the operating state of the SAR ADC. When ACS is enabled, it reduces the single-bit decision time of the comparator by at least 14%. The prototype ADC, implemented in a 40 nm Low-Leakage CMOS process, achieves post simulated SNDR and SFDR of 47.4 dB and 65.7 dB, respectively, at Nyquist frequency input. Operating at a 1.1 V single supply, the ADC consumes 1.16 mW, leading to the Walden figure of merit (FoMw) of 12.2 fJ/conv-step.
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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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