Chemical Mapping of Supramolecular Self-Assembled Monolayers via Atomic Force Microscopy-Based Infrared with a Nanometer-Scale Lateral Resolution

IF 4.8 2区化学 Q2 CHEMISTRY, PHYSICAL

The Journal of Physical Chemistry Letters Pub Date : 2025-03-27 DOI:10.1021/acs.jpclett.5c00360

Alexandre Dazzi, Frank Palmino, Ariane Deniset-Besseau, Jérémie Mathurin, Vincent Luzet, Peter De Wolf, Qichi Hu, Chunzeng Li, Cassandra Phillips, Frédéric Chérioux

引用次数: 0

Abstract

Atomic force microscopy-based infrared (AFM-IR) techniques have long enabled chemical imaging of surfaces with spatial resolutions down to 10 nm. In this study, we push the boundaries of AFM-IR spatial resolution to the single-nanometer scale, achieving chemical mapping of supramolecular networks at the submolecular level. This breakthrough is made possible by implementing an innovative tapping-mode AFM-IR approach. Such unprecedented resolution opens new horizons for advancements in nanoscience.

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来源期刊

The Journal of Physical Chemistry Letters CHEMISTRY, PHYSICAL-NANOSCIENCE & NANOTECHNOLOGY

CiteScore

9.60

自引率

7.00%

发文量

1519

审稿时长

1.6 months

期刊介绍： The Journal of Physical Chemistry (JPC) Letters is devoted to reporting new and original experimental and theoretical basic research of interest to physical chemists, biophysical chemists, chemical physicists, physicists, material scientists, and engineers. An important criterion for acceptance is that the paper reports a significant scientific advance and/or physical insight such that rapid publication is essential. Two issues of JPC Letters are published each month.