Sasa-Alexandra Yehia-Alexe , Mihai Serbanescu , Paul Dinca , Bogdan Butoi , Maria Elena Zarif , Corneliu Porosnicu , Andreea Groza
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引用次数: 0
Abstract
By laser induced plasma ablation and laser induced desorption methods was studied the release of deuterium atoms contained in 1 μm beryllium layers produced by thermionic vacuum arc technology combined with a plasma torch. For such purpose was used a 1053 nm nanosecond laser source with pulse duration of 10 ns, tuned in pulse energy and repetition rate, for reaching both laser induced plasma ablation and laser induced desorption regimes. The signals of the species released from the beryllium‑deuterium layers after the laser irradiation were recorded simultaneous using a high-resolution optical spectrometer and a quadrupole mass spectrometer. In the laser ablation plasma plume, optical emission bands characteristic to BeO, BeH/BeD, H2/D2, and SiO species were identified. Mass spectra analysis revealed the dependence of released deuterium atoms on laser operating parameters.
The amounts of deuterium atoms detected by quadrupole mass spectrometry at different laser pulse energies and repetition rates, were compared with the total amount of deuterium (4 × 1017 D/m2) measured by Thermal Desorption Spectroscopy. The results indicated that 100 % deuterium atoms were released in the laser induced plasma ablation regime, in one second, at 1 kHz laser repetition rate, after samples exposure to 1000 laser pulses. In laser induced desorption regime, at 10 Hz laser repetition rate, the exposure to 10 laser pulses in one second, lead to 10 % deuterium atoms release, the percentage decreasing to 1 % when Be/D layers are irradiated with 3 laser pulses. A discussion on the heating effects of the laser beam, as function of its operating parameters, on the layer surface morphologies is also presented.
期刊介绍:
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.