Experimental transition probabilities and oscillator strengths of singly ionised Xenon (Xe II) in the ultraviolet. A fully statistical approach to the determination of uncertainties

IF 3.2 2区 化学 Q1 SPECTROSCOPY
Maria Teresa Belmonte , Santiago Mar , Stevica Djurović , José Antonio Menéndez , Lazar Gavanski
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引用次数: 0

Abstract

We report 92 experimental values of transition probabilities and oscillator strengths for singly ionised xenon (Xe II) in the ultraviolet region (217–385 nm), 91 of which have been measured for the first time. The transition probabilities were obtained from the analysis of spectra emitted by a plasma in partial local thermodynamic equilibrium (pLTE) generated in a pulsed-discharge lamp. The resolving power of our experimental setup is 120,000 at 380 nm. The novelty of this work lies in its use of an exponential fitting technique rather than the linear Boltzmann Plot method. We include a detailed, purely statistical analysis of the uncertainties of our new measurements, together with an in-depth explanation of our measurements to promote transparency and reproducibility. We have implemented this fully statistical approach to the calculation of the uncertainties in a code developed in our laboratory, which can be freely downloaded from our laboratory's Zenodo repository to support Open Science and help other atomic data producers to calculate the uncertainties of their measurements. The uncertainties of our new transition probabilities are smaller than 15 % for 11 % of the lines and 30 % for 87 % of the spectral lines.

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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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