Analysis of false lock in Mueller-Muller clock and data recovery system

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Yahao Fang , Deng Luo , Bin Liang , Jianjun Chen , Yaqing Chi , Hanhan Sun , Qian Sun , Jingtian Liu
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引用次数: 0

Abstract

As serializer/deserializer (SerDes) architectures evolve to support multi-Gbps data rates, Four-level Pulse Amplitude Modulation (PAM4) has emerged as the dominant signaling scheme owing to its superior spectral efficiency. However, the conventional Mueller-Muller Clock and Data Recovery (MMCDR) architecture exhibits critical false lock artifacts when processing PAM4 signals, leading to significant degradation in Jitter Tolerance (JTOL) and Bit Error Rate (BER). Through theoretical analysis, we demonstrate that the root cause lies in the misalignment between the sampled signal and decision values during phase detection. To address this limitation, we introduce a novel Phase Detector (PD) architecture. A comprehensive CDR behavioral model integrating the proposed PD is developed in Simulink. Simulation results demonstrate that the improved PD avoids false lock compared to conventional MMPD implementations. Furthermore, the proposed PD achieves superior jitter tolerance performance. These advancements provide a hardware-efficient and readily implementable solution for high-speed PAM4 SerDes systems operating in lossy channels.
Mueller-Muller时钟及数据恢复系统中的假锁分析
随着序列化器/反序列化器(SerDes)架构的发展以支持多gbps的数据速率,四电平脉冲幅度调制(PAM4)由于其优越的频谱效率而成为主导的信令方案。然而,传统的Mueller-Muller时钟和数据恢复(MMCDR)架构在处理PAM4信号时表现出严重的假锁伪像,导致抖动容限(JTOL)和误码率(BER)显著降低。通过理论分析,我们证明了其根本原因是在相位检测过程中采样信号与判决值不一致。为了解决这一限制,我们引入了一种新的相位检测器(PD)架构。在Simulink中开发了一个综合的CDR行为模型。仿真结果表明,与传统的MMPD实现相比,改进的PD避免了误锁。此外,所提出的PD具有优越的抗抖动性能。这些进步为在有损信道中运行的高速PAM4 SerDes系统提供了硬件效率高且易于实现的解决方案。
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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