A digital background calibration method for SAR ADC based on dual-layer feedforward neural network

IF 1.9 3区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Microelectronics Journal Pub Date : 2025-03-22 DOI:10.1016/j.mejo.2025.106645

Tiehu Li , Jintao Huang , Jun Zeng , Chaodong Guo , Wei Zhang , Xiaojun Fu , Daiguo Xu , Gang Yan , Junyi Jiang , Rui Lai , Jun-an Zhang

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引用次数: 0

Abstract

This paper addresses the impact of capacitor mismatch, comparator offset, and incomplete settling of the digital-to-analog converter (DAC) on the dynamic performance of Successive Approximation Register (SAR) Analog-to-Digital Converters (ADCs). A digital background calibration method using a double-layer feedforward neural network is proposed. The network is trained in MATLAB and implemented on an FPGA to validate the calibration algorithm. The study explores the influence of parameters like the number of neurons, training samples, and iterations on performance. FPGA results show that, after calibration, the Spurious-Free Dynamic Range (SFDR) and Signal-to-Noise-and-Distortion Ratio (SNDR) of a 12-bit 100 MSPS SAR ADC model improved from 46.58 dB and 46.53 dB to 98.10 dB and 70.87 dB. Similarly, for a 10-bit 31.25 MSPS SAR ADC chip, SFDR and SNDR increased from 61.46 dB and 46.86 dB to 79.87 dB and 57.09 dB. These results confirm the proposed method’s effectiveness for addressing non-idealities in both simulated models and hardware.

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来源期刊

Microelectronics Journal 工程技术-工程：电子与电气

CiteScore

4.00

自引率

27.30%

发文量

222

审稿时长

43 days

期刊介绍： Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.