Tianxiao Liu, Hao Sun, Yushi Zhang, Jianqiao Xiao, Yang Lu, Chunping Niu, Yi Wu
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引用次数: 0
Abstract
SF6 is extensively utilized in gas circuit breakers due to its superior arc-quenching capabilities. However, its strong greenhouse effect and relatively high liquefaction temperature have led to the adoption of buffering gases, such as CO2, in combination with SF6. Investigating the post-arc process in gas plasma is essential for assessing the arc-quenching performance of the gases and potential applications. Nevertheless, precise diagnostics during the post-arc phase remain challenging due to the non-equilibrium nature and poor stability of the plasma. This study developed a coherent laser Thomson scattering platform to measure the post-arc decay characteristics of gas arcs. A custom triple-grating spectrometer was incorporated to enhance the signal-to-noise ratio at low electron densities. The spatiotemporal electron density decay characteristics of pure SF6 arcs under varying pressures and SF6/CO2 mixed-gas arcs with different mixing ratios were examined. The results show that, during the thermal recovery phase (0–70 μs), all gas arcs exhibit substantial energy dissipation, with the electron density at the arc center decreasing by two orders of magnitude. As pressure increases, the diameter of the pure SF6 arc contracts, and the central electron density initially rises. With increasing pressure, a competition emerges between chemical reactions and diffusion-convection effects as the dominant factors influencing electron dissipation. The introduction of buffering gas reduces the recombination rate of positive ions and electrons, thereby decelerating the plasma decay rate. Both the initial electron density and plasma diameter diminish with increasing SF6 content in the mixture.
期刊介绍:
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.