Measurement of Kβ/Kα X-ray intensity ratios in nickel, cobalt, copper and zinc doped WO3 thin films

Abstract

In this study, the Kβ/Kα X-ray intensity ratios of tungsten oxide (WO₃) thin films doped with 10–20 % Ni, Co, Cu and Zn transition metals by spray pyrolysis method were investigated by X-ray fluorescence technique (XRF). A²⁴¹Am radioactive source emitting a beam with an intensity of 5 Ci (∼185 GBq) and an energy of 59.543 keV was used to excite the samples. A HPGe detector with a resolution of 180 eV at 5.96 keV was used to count the characteristic X-rays emitted from the thin films. The impact of doping transition metals on the crystal structure of WO₃ thin films was investigated using XRD analysis, while their morphological properties were examined via scanning electron microscopy (SEM) coupled with energy-dispersive X-ray spectroscopy (EDX). It was observed that the Kβ/Kα X-ray intensity ratios increased in accordance with the concentrations of transition metals doped into the WO₃ thin film samples. The values obtained from the Kβ/Kα X-ray intensity ratios were compared with the findings of theoretical and experimental studies for pure Ni, Co, Cu and Zn elements. XRD analysis revealed that undoped tungsten oxide and nickel, cobalt and copper doped thin films have an amorphous structure, while zinc doped tungsten oxide thin film has a monoclinic structure.